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Hello, Please ask a question about CDP1822 Datasheet
# Example questions:
➢ What is the typical write cycle time (twc) for the cdp1822 at a vdd of 5v?
➢ What is the minimum data retention voltage (vdr) for the cdp1822c?
➢ What is the typical quiescent current (idd) during data retention for the cdp1822c?
1. General Device Information and Features (Gathered from scattered info)
️· Device Types: CDP1822, CDP1822C. The 'C' suffix likely denotes a minor variation/improved version.
️· Organization: 8K x 32 bit static RAM array.
️· Technology: CMOS (Complementary Metal-Oxide-Semiconductor)
️· Key Features (Implied): Static RAM (no refresh needed), likely high-speed, power-efficient (due to CMOS). Includes Data Retention functionality with a specific voltage requirement.
️· Data Retention: Implies a power-saving mode where data is held with a lower voltage (VDR). This is significant for applications where power is limited.
2. Electrical Characteristics (Key Values & Conditions)
️· Supply Voltage (VDD): (Not directly stated, but implied to be standard 5V)
️· Minimum Data Retention Voltage (VDR): 1.5V (typical 2V)
️· Data Retention Quiescent Current (IDD): 30µA (typical 100µA). This is the current drawn when data is being retained.
️· Access Time: Varies based on voltage conditions (500ns/300ns). Indicates a design where speed is dependent on proper voltage.
️· Minimum Data Retention Voltage (VDR): 1.5V
3. Timing Parameters (Critical for Operation)
These define the correct sequence and duration of signals needed for read, write, and retention operations. They're denoted with 't' prefixes (e.g., tWC, tAS). There are *many* of these, representing different timing relationships. It's vital to refer to the diagrams within the full datasheet to fully understand them. I’m giving a summary of some key ones:
️· Read Cycle Time (tWC): 500ns / 300ns. The time required to complete a read operation.
️· Address Setup Time (tAS): 200ns / 110ns. Time address must be stable before data is valid.
️· Write Recovery Time (tWR): 50ns / 40ns. Time data must be stable before write enable is deactivated.
️· Chip Select Setup/Hold Times (tCS1S, tCS2S, tCS1H, tCS2H): Important for coordinating operations with other devices.
️· Data Input Setup/Hold Times (tDS, tDH): Define timing of data input relative to control signals.
️· Retention Times (tCDR, tRC): These dictate the time the data will stay in the RAM during the retention mode.
4. Data Retention Functionality (Specifics)
️· Purpose: Allows the RAM to conserve power by entering a low-power state where data is held without continuous power.
️· Data Retention Voltage (VDR): A lower voltage (1.5V minimum, 2V typical) is used to hold the data.
️· Data Retention Current (IDD): The current drawn during the retention mode is significantly reduced.
️· Entry and Exit Times (tCDR, tRC): Specify the time required to enter and exit the data retention mode.
5. Control Signals
️· Chip Select (CS1, CS2): Used to enable or disable the RAM.
️· Output Disable (OD): Used to control the output buffer.
️· Write Enable (WE): Activates the write operation.
️· Read Enable (RE): Activates the read operation.
Important Caveats and Notes:
️· Full Datasheet Needed: This is an *extract*. A complete datasheet would contain diagrams, timing waveforms, pinouts, package information, and more detailed explanations of the timing parameters.
️· Conditions: All the electrical and timing values are subject to specific test conditions (temperature, voltage, load capacitance).
️· Device Variations: The "C" version (CDP1822C) likely has slightly different characteristics compared to the standard CDP1822. Always refer to the datasheet for the specific version being used.
️· Timing Relationships: The timing parameters are intricately related. Incorrect timing can lead to data corruption or malfunction.
1. General Device Information and Features (Gathered from scattered info)
️· Device Types: CDP1822, CDP1822C. The 'C' suffix likely denotes a minor variation/improved version.
️· Organization: 8K x 32 bit static RAM array.
️· Technology: CMOS (Complementary Metal-Oxide-Semiconductor)
️· Key Features (Implied): Static RAM (no refresh needed), likely high-speed, power-efficient (due to CMOS). Includes Data Retention functionality with a specific voltage requirement.
️· Data Retention: Implies a power-saving mode where data is held with a lower voltage (VDR). This is significant for applications where power is limited.
2. Electrical Characteristics (Key Values & Conditions)
️· Supply Voltage (VDD): (Not directly stated, but implied to be standard 5V)
️· Minimum Data Retention Voltage (VDR): 1.5V (typical 2V)
️· Data Retention Quiescent Current (IDD): 30µA (typical 100µA). This is the current drawn when data is being retained.
️· Access Time: Varies based on voltage conditions (500ns/300ns). Indicates a design where speed is dependent on proper voltage.
️· Minimum Data Retention Voltage (VDR): 1.5V
3. Timing Parameters (Critical for Operation)
These define the correct sequence and duration of signals needed for read, write, and retention operations. They're denoted with 't' prefixes (e.g., tWC, tAS). There are *many* of these, representing different timing relationships. It's vital to refer to the diagrams within the full datasheet to fully understand them. I’m giving a summary of some key ones:
️· Read Cycle Time (tWC): 500ns / 300ns. The time required to complete a read operation.
️· Address Setup Time (tAS): 200ns / 110ns. Time address must be stable before data is valid.
️· Write Recovery Time (tWR): 50ns / 40ns. Time data must be stable before write enable is deactivated.
️· Chip Select Setup/Hold Times (tCS1S, tCS2S, tCS1H, tCS2H): Important for coordinating operations with other devices.
️· Data Input Setup/Hold Times (tDS, tDH): Define timing of data input relative to control signals.
️· Retention Times (tCDR, tRC): These dictate the time the data will stay in the RAM during the retention mode.
4. Data Retention Functionality (Specifics)
️· Purpose: Allows the RAM to conserve power by entering a low-power state where data is held without continuous power.
️· Data Retention Voltage (VDR): A lower voltage (1.5V minimum, 2V typical) is used to hold the data.
️· Data Retention Current (IDD): The current drawn during the retention mode is significantly reduced.
️· Entry and Exit Times (tCDR, tRC): Specify the time required to enter and exit the data retention mode.
5. Control Signals
️· Chip Select (CS1, CS2): Used to enable or disable the RAM.
️· Output Disable (OD): Used to control the output buffer.
️· Write Enable (WE): Activates the write operation.
️· Read Enable (RE): Activates the read operation.
Important Caveats and Notes:
️· Full Datasheet Needed: This is an *extract*. A complete datasheet would contain diagrams, timing waveforms, pinouts, package information, and more detailed explanations of the timing parameters.
️· Conditions: All the electrical and timing values are subject to specific test conditions (temperature, voltage, load capacitance).
️· Device Variations: The "C" version (CDP1822C) likely has slightly different characteristics compared to the standard CDP1822. Always refer to the datasheet for the specific version being used.
️· Timing Relationships: The timing parameters are intricately related. Incorrect timing can lead to data corruption or malfunction.
| Part No. | CDP1822 |
| Manufacturer | INTERSIL |
| Size | 45 Kbytes |
| Pages | 8 pages |
| Description | 256-Word x 4-Bit LSI Static RAM |
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