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IS25LEG-RHLA2:P-TY Datenblatt(PDF) 187 Page - Integrated Silicon Solution, Inc |
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IS25LEG-RHLA2:P-TY Datenblatt(HTML) 187 Page - Integrated Silicon Solution, Inc |
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187 / 193 page ![]() IS25LE01GG IS25WE01GG Integrated Silicon Solution, Inc.- www.issi.com 187 Rev. A3 10/02/2025 9.9 PROGRAM/ERASE PERFORMANCE Symbol Parameter Typ Max Unit tEC Sector Erase Time 4KB 100 300 ms Block Erase Time 32KB 0.14 0.5 s 64KB 0.17 1.5 256KB 0.68 4.0 Chip Erase Time 280 720 tPP Page Programming Time 256B 0.3 2.0 ms 512B 0.6 4.0 tBP First Byte Program 10 70 µs Note: These parameters are characterized and not 100% tested. 9.10 RELIABILITY CHARACTERISTICS Parameter Min Max Unit Test Method Endurance 100,000 - Cycles JEDEC Standard A117 Latch-Up -100 +100 mA JEDEC Standard 78 Note: These parameters are characterized and not 100% tested. 9.11 DATA RETENTION CHARACTERISTICS Parameter Test Conditions Typ Unit Test Method Data Retention 100K Program/Erase Cycles, 55°C 120 Year JEDEC Standard 47I PCHTDR 100K Program/Erase Cycles, 75°C 12.8 Year Note: These parameters are characterized and not 100% tested. |
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