STM32F413MH datasheet(141/207 Pages) STMICROELECTRONICS

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STM32F413xG/H

Electrical characteristics

174

QSPI interface characteristics

Unless otherwise specified, the parameters given in the following tables for QSPI are

derived from tests performed under the ambient temperature, fAHB frequency and VDD

supply voltage conditions summarized in Table 16, with the following configuration:

•

Output speed is set to OSPEEDRy[1:0] = 11

•

Capacitive load C=20pF

•

Measurement points are done at CMOS levels: 0.5VDD

Refer to Section 6.3.16: I/O port characteristics for more details on the input/output alternate

function characteristics.

Table 69. QSPI dynamic characteristics in SDR mode(1)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

fSCK

1/tc(SCK)

QSPI clock frequency

2.7 V < VDD < 3.6 V

Cload = 20 pF

100

MHz

1.71 V < VDD < 3.6 V

Cload = 15 pF

tw(CKH)

QSPI clock high and low

t(CK) / 2 - 1

t(CK) / 2

tw(CKL)

t(CK) / 2

t(CK) / 2 + 1

ts(IN)

Data input setup time

1.5

th(IN)

Data input hold time

tv(OUT)

Data output valid time

2.7 V < VDD < 3.6 V

0.5

1.71 V < VDD < 3.6 V

0.5

th(OUT)

Data output hold time

1. Guaranteed by characterization results.

Table 70. QSPI dynamic characteristics in DDR mode(1)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

fSCK

1/tc(SCK)

QSPI clock frequency

2.7 V < VDD < 3.6 V

Cload = 20 pF

MHz

1.71 V< VDD < 3.6 V

Cload = 15 pF

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