1. Device Description:

️· Type: 32K x 8 SRAM (Static Random Access Memory)
️· Purpose: Designed for space and defense applications requiring radiation hardness and reliability.

2. Radiation Hardness and Quality Assurance:

️· Radiation Hardened Technology: Built on Honeywell’s RICMOS™ process, specifically designed for resistance to radiation effects.
️· Testing: Extensive radiation testing is performed (Cobalt 60 irradiation) and monitored.
️· Quality Systems: Employs statistical process control and a Total Quality Assurance System.
️· Screening Levels: Various screening levels are available (Engineering Devices, Hi-Rel Level B and S, QML Class Q and V).

3. Reliability:

️· Comprehensive Testing: Reliability attributes are characterized through testing in accelerated dynamic life test conditions.
️· MIL-STD-883: Complies with MIL-STD-883 testing standards (Groups B & D).
️· Quality Conformance: Ongoing quality conformance testing is performed.

4. Packaging:

️· Options: Available in 28-lead DIP, 28-lead Flatpack (FP), and 36-lead Flatpack.
️· Construction: Packages are multilayer ceramic (Al2O3) with internal power and ground planes.
️· 36-lead FP Features:
- Tie bar (for lead integrity)
- Option for bottom-brazed capacitors (for noise decoupling)
- Lid connected to VSS (ground).
️· Important Note: All NC (No Connect) pins *must* be connected to VDD, VSS, or an active driver to prevent charge buildup.

5. Electrical Characteristics:

️· The document provides tester AC timing characteristics and refers to the electrical characteristics being defined elsewhere.

6. Key Documents Referenced:

️· MIL-STD-883
️· MIL-PRF-38535
️· MIL-STD-1835