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HX6256 Datenblatt(PDF) 2 Page - Honeywell Solid State Electronics Center |
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HX6256 Datenblatt(HTML) 2 Page - Honeywell Solid State Electronics Center |
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2 / 13 page ![]() HX6256 2 www.honeywell.com/radhard FUNCTIONAL DIAGRAM SIGNAL DEFINITIONS A: 0-14 Address input pins which select a particular eight-bit word within the memory array. DQ: 0-7 Bidirectional data pins which serve as data outputs during a read operation and as data inputs during a write operation. NCS Negative chip select, when at a low level allows normal read or write operation. When at a high level NCS forces the SRAM to a precharge condition, holds the data output drivers in a high impedance state and disables all input buffers except CE. If this signal is not used it must be connected to VSS. NWE Negative write enable, when at a low level activates a write operation and holds the data output drivers in a high impedance state. When at a high level NWE allows normal read operation. NOE Negative output enable, when at a high level holds the data output drivers in a high impedance state. When at a low level, the data output driver state is defined by NCS, NWE and CE. If this signal is not used it must be connected to VSS. CE* Chip enable, when at a high level allows normal operation. When at a low level CE forces the SRAM to a precharge condition, holds the data output drivers in a high impedance state and disables all the input buffers except the NCS input buffer. If this signal is not used it must be connected to VDD. TRUTH TABLE NCS CE* NWE NOE MODE DQ L H H L Read Data Out L H L X Write Data In H X XX XX Deselected High Z X L XX XX Disabled High Z *Not Available in 28-lead DIP or 28-Lead Flat Pack Notes: X: VI=VIH or VIL XX: VSS≤VI≤VDD NOE=H: High Z output state maintained for NCS=X, CE=X, NWE=X |
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