1 Features
• Vendor item drawing available, VID V62/23610
• Total ionizing dose (TID) characterized to
30 krad(Si)
– RLAT (radiation lot acceptance testing) to
20 krad(Si)
• Single-event effects (SEE) characterized
– Single-event latch-up (SEL), single-event
burnout (SEB), and single-event gate rupture
(SEGR) immune to linear energy transfer (LET)
of 43 MeV-cm2/mg
– Single-event transient (SET) and single-event
functional interrupt (SEFI) characterized to
effective linear energy transfer (LET) of
43 MeV-cm2/mg
• Quad-channel 160-mΩ eFuse with full diagnostics
and current-sense analog output
• Wide operating voltage 4.5 V to 32 V
• Ultra-low standby current < 500 nA
• High-accuracy current sense: ±15% when
ILOAD ≥ 25 mA
• Adjustable current limit with external resistor (RCL),
with accuracy of ±15% when ILOAD ≥ 500 mA
• Protection
– Short-to-GND protection by current limit
(internal or external)
– Thermal shutdown with latch off option and
thermal swing
– Inductive load negative voltage clamp with
optimized slew rate
– Loss-of-GND and loss-of-power protection
• Diagnostics
– Overcurrent and short-to-ground detection
– Open-load and short-to-power detection
– Global fault report for fast interrupt
• 28-pin thermally-enhanced PWP package
• Space Enhanced Plastic (SEP)
• Available in military (–55°C to 125°C) temp range

2 Applications
• Satellite electrical power systems (EPS)
• Space satellite power management and
distribution
• Radiation-tolerant power tree applications
• Enables switching power rails for controlled power
up and power down
• Solenoid driving

3 Description
The TPS7H2140-SEP device is a fully protected
quad-channel eFuse with four integrated 160-mΩ
NMOS power FETs.
Full diagnostics and high-accuracy current sense
enables intelligent control of the loads.
An external adjustable current limit improves the
reliability of whole system by limiting the inrush or
overload current.