Members of the Texas Instruments
SCOPE E Family of Testability Products
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Serial Test Bus
Allow Partitioning of System Scan Paths
Can Be Cascaded Horizontally or Vertically
Select Up to Four Secondary Scan Paths to
Be Included in a Primary Scan Path
Include 8-Bit Programmable Binary Counter
to Count or Initiate Interrupt Signals
Include 4-Bit Identification Bus for
Scan-Path Identification
Inputs Are TTL Compatible
EPIC E (Enhanced-Performance Implanted
CMOS) 1-mm Process
Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic
(NT) and Ceramic (JT) 300-mil DIPs

description
The ’ACT8997 are members of the Texas
Instruments SCOPEE testability integratedcircuit
family. This family of components facilitates
testing of complex circuit-board assemblies.
The ’ACT8997 enhance the scan capability of TI’s
SCOPEE family by allowing augmentation of a
system’s primary scan path with secondary scan
paths (SSPs), which can be individually selected
by the ’ACT8997 for inclusion in the primary scan
path. These devices also provide buffering of test
signals to reduce the need for external logic.
By loading the proper values into the instruction
register and data registers, the user can select up
to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time. Any
of the device’s six data registers or the instruction register can be placed in the device’s scan path, i.e., placed
between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations.
All operations of the device except counting are synchronous to the test clock pin (TCK). The 8-bit
programmable up/down counter can be used to count transitions on the device condition input (DCI) pin and
output interrupt signals via the device condition output (DCO) pin. The device can be configured to count on
either the rising or falling edge of DCI.
The test access port (TAP) controller is a finite-state machine compatible with IEEE Standard 1149.1.
The SN54ACT8997 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74ACT8997 is characterized for operation from 0°C to 70°C.