Description
E42X7 is a family of Dual Channel Parametric Measurement Units (PMU) designed for automated test equipment and instrumentation. Manufactured in a wide voltage Bi-CMOS process, it is a monolithic solution for a
per-pin PMU.

The E42X7 family consists of three products:
E4287
• 16.25V I/O range
• 4 current ranges up to ± 40 mA
• Analog mux for providing a FLASHTM programming level
• Driven guard pin

E4257
• 16.25V I/O range
• 4 Current ranges up to ± 40 mA
• Small 9mm x 9mm footprint

E4237
• 16.25VI/O range
• 2 current ranges up to ± 4 mA
• Low capacitance for use in relayless tester architectures

Features
• Four Quadrant Operation (FV/MI, FV/MV, FI/MV, FI/MI)
• 4 Current Ranges (± 40 µA, ± 400 µA, ± 4 mA, ± 40 mA) (E4287, E4257)
• 2 Current Ranges (± 40 µA and ± 4 mA) (E4237)
• Wide Output Voltage Range
   – –3.25V to +13V @ RF pin across all ranges
   – –3.25V to ± 13V @ FORCE Pin (Ranges A, B, C)
   – –1.25V to +11V @ FORCE (Range D)
• Low Power Dissipation
• FV Linearity to ± 0.025% FSVR
• Extremely Fast Settling Times offer reduced test times/increased tester thru-put.
• Central PMU Switches for External PMU,
   –4.75 V to +14.5V, ± 40 mA Ranges
• Switches for Pin Driver Super Voltages
• Driven Guard Output (E4287)
• Test Head Ground Reference
• Stable with up to 300 pF Capacitive Loading with no external compensation capacitors
• Switchable Compensation allows stability with up to 10 nF Capacitive Loading
• 14x14 mm, 80 Pin MQFP Package (E4287)
• Small, 9x9 mm, 64-Pad LPCC Package (E4237, E4257)

Applications
• Automated Test Equipment
   – Memory Testers
   – Logic Testers
   – Mixed Signal Testers
   – SOC Testers
• Instrumentation