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1GP6002 Datenblatt (PDF) - Honeywell Solid State Electronics Center

1GP6002 Datasheet PDF - Honeywell Solid State Electronics Center
Teilenummer 1GP6002
Download  1GP6002 Download
Filegröße   66.1 Kbytes
Page   1 Pages
Hersteller  HONEYWELL [Honeywell Solid State Electronics Center]
Direct Link  http://honeywell.com/Pages/Home.aspx
Logo HONEYWELL - Honeywell Solid State Electronics Center
Bauteilbeschribung 30V CONTINUOS

1GP6002 Datasheet (PDF)

Go To PDF Page Download Datenblatt
1GP6002 Datasheet PDF - Honeywell Solid State Electronics Center

Teilenummer 1GP6002
Download  1GP6002 Click to download

Filegröße   66.1 Kbytes
Page   1 Pages
Hersteller  HONEYWELL [Honeywell Solid State Electronics Center]
Direct Link  http://honeywell.com/Pages/Home.aspx
Logo HONEYWELL - Honeywell Solid State Electronics Center
Bauteilbeschribung 30V CONTINUOS

1GP6002 Datenblatt (HTML) - Honeywell Solid State Electronics Center





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Über Honeywell Solid State Electronics Center


Honeywell Solid State Electronics Center (SSEC) was a research and development facility of Honeywell Inc. that operated from 1957 to 1993 in Minneapolis, Minnesota, United States. The center was dedicated to the research, development, and production of solid-state electronics, including microelectronics, semiconductors, and related technologies.

During its operation, SSEC made significant contributions to the advancement of the semiconductor industry, particularly in the areas of integrated circuits, transistor design, and fabrication processes. Notable accomplishments of SSEC include the development of the first silicon transistor, the first commercial silicon planar transistor, and the first integrated circuit to use metal oxide semiconductor (MOS) technology.

In 1993, Honeywell closed the SSEC facility as part of a broader restructuring of its operations. The company's semiconductor business was subsequently sold to SGS-Thomson (now STMicroelectronics) in 1999.

*Diese Informationen dienen nur zu allgemeinen Informationszwecken. Wir haften nicht für Verluste oder Schäden, die durch die oben genannten Informationen verursacht werden.




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