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K6F2016V4E Datenblatt(PDF) 8 Page - Samsung semiconductor

Teilenummer K6F2016V4E
Bauteilbeschribung  128K x16 bit Super Low Power and Low Voltage Full CMOS Static RAM
PDF  9 Pages
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Hersteller  SAMSUNG [Samsung semiconductor]
Direct Link  http://www.samsung.com/Products/Semiconductor
Logo SAMSUNG - Samsung semiconductor

K6F2016V4E Datenblatt(HTML) 8 Page - Samsung semiconductor

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CMOS SRAM
K6F2016V4E Family
- 8 -
Revision 1.0
March 2002
Address
CS
Data Valid
UB, LB
WE
Data in
Data out
High-Z
High-Z
TIMING WAVEFORM OF WRITE CYCLE(3) (UB, LB Controlled)
NOTES (WRITE CYCLE)
1. A write occurs during the overlap(tWP) of low CS and low WE. A write begins when CS goes low and WE goes low with asserting UB
or LB for single byte operation or simultaneously asserting UB and LB for double byte operation. A write ends at the earliest transi-
tion when CS goes high and WE goes high. The tWP is measured from the beginning of write to the end of write.
2. tCW is measured from the CS going low to the end of write.
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end of write to the address change. tWR is applied in case a write ends with CS or WE going high.
tWC
tCW(2)
tBW
tWP(1)
tDH
tDW
tWR(4)
tAW
DATA RETENTION WAVE FORM
CS or LB/UB controlled
VCC
3.0V
2.2V
VDR
CS or LB/UB
GND
Data Retention Mode
CS
≥VCC-0.2V or LB=UB≥Vcc-0.2V
tSDR
tRDR
tAS(3)



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