| Datenblatt-Suchmaschine für elektronische Bauteile |
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FS9721_LP1 Datenblatt(PDF) 32 Page - Fortune Semiconductor Corp. |
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FS9721_LP1 Datenblatt(HTML) 32 Page - Fortune Semiconductor Corp. |
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32 / 41 page ![]() FS9721_LP1 Rev. 2.0 33/41 14.16 Short Circuit Testing J6 J4 FS9721_LP1 TENM ONEK SMV SGND AGND PTC 1k Continuity COM R27 10M R23 1k R20 900k R18 10k Rx Diagram 30 Short Circuit Testing Short circuit testing is proceeded in 400Ωresistance mode. 0.4V voltage (relative to AGND) is generated by internal IC and output through R23, then add to short measuring point through PTC. J4 and J6 are mode switch and are close during doing short circuit testing. Rx gets voltage VRx, and input IC through R20. If Rx smaller than 50Ω, the beeper will sound. 14.17 Capacitance Measurement R22 57.4k R20 900k R18 10k RCAP SMV SGND PTC 1k Cap COM CX FS9721_LP1 J4 J6 DO- DO+ DO- DO+ CMP DO+ DO- + - VDD AGND 3/4VDD 1/4VDD Typical Wave of Input End 3/4VDD 1/4VDD VDD Tdo Diagram 31 Capacitance Measurement |
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