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TDP1500 Datenblatt(PDF) 8 Page - TEKTRONIX, INC. |
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TDP1500 Datenblatt(HTML) 8 Page - TEKTRONIX, INC. |
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8 / 28 page ![]() USB 2.0 Automated Compliance Testing. Power analysis (optional) The optional power analysis software package (Option PWR) enables quick and accurate analysis of power quality, switching loss, harmonics, magnetic measurements, safe operating area (SOA), modulation, ripple, amplitude and timing measurements, and slew rate (di/dt, dv/dt). Automated, repeatable power measurements are available with a touch of a button; no external PC or complex software setup is required. The package includes a report generation tool to automatically create detailed reports to document your measurement results. Switching Loss measurements. Automated power measurements enable quick and accurate analysis of common power parameters. Advanced analysis jitter timing and eye diagram measurements (optional) The optional DPOJET Advanced software package (Option DJA) offers extended capabilities, providing a complete suite of analysis tools for insight into jitter, timing and other signal quality issues. DPOJET Advanced adds advanced tools such as Rj/Dj separation, eye diagram masks, and Pass/Fail limits for conformance testing. The innovative one-touch wizard makes setup for jitter measurements easy. DPOJET Advanced is also a measurement framework that works with standards-specific compliance test packages for applications such as DDR memory and USB 2.0. Advanced analysis, jitter, eye diagram, and timing measurements. Limit and mask testing The standard limit test and optional mask test (Option MTM) software packages are useful for long-term signal monitoring, characterizing signals during design, and testing on a production line. The limit test software compares a tested signal to a known good or "golden" version of the same signal with user-defined vertical and horizontal tolerances. The mask test software includes a robust set of masks for telecommunications and computer standards for easily checking compliance to a standard. Additionally, custom masks can be created and used for characterizing signals. With both software packages you can tailor a test to your specific requirements by defining test duration in number of waveforms, setting a violation threshold that must be met before considering a test a failure, counting hits along with statistical information, and setting actions upon violations, test failure, and test complete. Whether specifying a limit template or a mask, conducting pass/fail tests in search of waveform anomalies such as glitches has never been easier. Datasheet 8 www.tek.com/DPO7000 |
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