If MilitaryAerospace specified devices are required

please contact the National Semiconductor Sales

OfficeDistributors for availability and specifications

b

b

20 mA

a

20 mA

b

b

20 mA

a

20 mA

b

DC Output Source

g

50 mA

g

50 mA

b

SOIC

140 C

Note 1

Absolute maximum ratings are values beyond which damage to the

device may occur The databook specifications should be met without ex-

ception to ensure that the system design is reliable over its power supply

temperature and outputinput loading variables National does not recom-

Recommended Operating

Conditions

’ACT

45V to 55V

74ACT

b

Minimum Input Edge Rate (DV Dt)

’ACT Devices

45V 55V

125 mVns

DC Characteristics for ’ACT Family Devices

Symbol

Parameter

(V)

74ACT

74ACT

Units

Conditions

b

Typ

Guaranteed Limits

Minimum High Level

45

15

20

20

V

Input Voltage

55

15

20

20

Maximum Low Level

45

15

08

08

V

Input Voltage

55

15

08

08

Minimum High Level

45

449

44

44

V

Output Voltage

55

549

54

54

45

386

376

b

24 mA

55

486

476

b

24 mA

Maximum Low Level

45

0001

01

01

V

Output Voltage

55

0001

01

01

45

036

044

24 mA

55

036

044

24 mA

Maximum Input

55

g

01

g

10

m

A

Leakage Current

55

06

15

mA

Minimum Dynamic

55

75

mA

Output Current

55

b

75

mA

Maximum Quiescent

55

40

400

m

A

Supply Current

or GND

All outputs loaded thresholds on input associated with output under test

Maximum test duration 20 ms one output loaded at a time

3