MLL4100CTR datasheet(3/3 Pages) MICROSEMI

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Microsemi

Scottsdale Division

8700 E. Thomas Rd. PO Box 1390, Scottsdale, AZ 85252 USA, (480) 941-6300, Fax: (480) 947-1503

Page 3

 2002

11-05-03 REV C

SCOTTSD A L E DIVISION

1N4099UR thru 1N4135UR

(or MLL4099 thru MLL4135)

and

1N4614UR thru 1N4627UR

(or MLL4614 thru MLL4627)

GRAPHS and CIRCUIT

TEC

TEC, End Cap Temperature (

oC) or TA

Ambient temperature on FR4 PC board

FIGURE 2 Power Derating Curve

Capacitance vs. VZ Curve

FIGURE 1 Noise Density Measurement Circuit

FIGURE 3 Capacitance vs. Zener Voltage (Typical)

Zener Voltage VZ

Noise density, (ND) is specified in microvolt-rms per squre-

root-hertz. Actual measurement is performed using a 1 KHz

to 3 KHz frequency bandpass filter at a constant Zener test

current (IZT) AT 25

oC ambient temperature. ND is calculated

from the formula.

PACKAGE DIMENSIONS

INCHES

MILLIMETERS

DIM

MIN

MAX

MIN

MAX

0.063

0.067

1.60

1.70

0.130

0.146

3.30

3.70

0.016

0.022

0.41

0.55

PAD LAYOUT

INCHES

.200

5.08

.055

1.40

.080

2.03

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