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TLK2521 Datenblatt(PDF) 9 Page - Texas Instruments

Teilenummer TLK2521
Bauteilbeschribung  1 to 2.5 Gbps TRANSCEIVER
PDF  19 Pages
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Hersteller  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

TLK2521 Datenblatt(HTML) 9 Page - Texas Instruments

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TLK2521
1 to 2.5 Gbps TRANSCEIVER
SLLS574B − JULY 2003 − REVISED JANUARY 2004
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions (Continued)
TERMINAL
TYPE
DESCRIPTION
NAME
NO.
TYPE
DESCRIPTION
SIGNAL PIN (CONTINUED)
SYNC
25
Input
(w/pulldown)
Fast synchronization. When asserted high, the transmitter substitute the 18-bit pattern
111111111000000000 ,so that when the start/stop bits are framed around the data the receiver can
immediately detect the proper deserialization boundary. This is typically used during initialization of
the serial link.
PREEMPH
56
Input
Preemphasis. When asserted, the serial transmit outputs have an extra output swing on the first bit
of any run-length of same value bits than when deasserted.
TEST PIN
ENABLE
24
Input
(w/pullup)
Device enable. When this pin is held low, the device is placed in power down mode. When asserted
high while the device is in power-down mode, the transceiver goes into power-on reset before
beginning normal operation.
LOOPEN
21
Input
(w/pulldown)
Loop enable. When LOOPEN is active high, the internal loop−back path is activated. The transmitted
serial data is directly routed internally to the inputs of the receiver. This provides a self-test capability
in conjunction with the protocol device. The DOUTTXP and DOUTTXN outputs are held in a
high-impedance state during the loop-back test. LOOPEN is held low during standard operational
state with external serial outputs and inputs active.
LOCKB
26
Output
Receiver lock. When asserted low, it indicates that the receiver has acquired bit synchronization on
the data stream and has located the start/stop bits, so that the deserialized data presented on the
parallel receive bus is properly received.
TESTEN
27
Input
(w/pulldown)
Test mode enable. This pin should be left unconnected or tied low.
POWER PIN
VDD
1, 9,
23, 38,
48
Supply
Digital logic power. Provides power for all digital circuitry and digital I/O buffers.
VDDA
55, 57
Supply
Analog power. VDDA provides a supply reference for the high-speed analog circuits, receiver and
transmitter.
GROUND PIN
GNDA
52, 58,
61
Ground
Analog ground. GNDA provides a ground reference for the high-speed analog circuits, RX and TX.
GND
5, 13,
18, 28,
33, 43
Ground
Digital logic ground. Provides a ground for the logic circuits and digital I/O buffers.
absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Supply voltage, VDD (see Note 1)
−0.3 V to 3 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltage range at TXD, ENABLE, GTX_CLK, LOOPEN, SYNC, PREEMPH
−0.3 V to 4 V
. . . . . . . . . . . . . . . . . . .
Voltage range at any other terminal except above
−0.3 V to VCC + 0.3 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Package power dissipation, PD
See Dissipation Rating Table
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature, Tstg
−65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Electrostatic discharge
HBM:2 kV, CDM:1.5 kV
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Characterized free-air operating temperature range
−40
°C to 85°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead Temperature 1,6 mm (1/16 inch) from case for 10 seconds
260
°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values, except differential I/O bus voltages, are with respect to network ground.



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