74ALS00AD datasheet(4/8 Pages) PHILIPS

4 / 8 page

Philips Semiconductors

Product specification

74ALS00A

Quad 2-input NAND gate

1991 Feb 08

AC ELECTRICAL CHARACTERISTICS

LIMITS

SYMBOL

PARAMETER

TEST CONDITION

Tamb = 0°C to +70°C

VCC = +5.0V ± 10%

CL = 50pF, RL = 500Ω

UNIT

MIN

MAX

tPLH

tPHL

Propagation delay

nA, nB to nY

Waveform 1

2.0

11.0

8.0

AC WAVEFORMS

For all waveforms, VM = 1.3V.

tPLH

tPHL

nA, nB

SC00004

Waveform 1.

Propagation Delay for Data to Output

TEST CIRCUIT AND WAVEFORMS

90%

10%

90%

10%

90%

10%

90%

10%

NEGATIVE

PULSE

POSITIVE

PULSE

AMP (V)

0.3V

tTHL (tff)

INPUT PULSE REQUIREMENTS

Rep.Rate

tTLH

tTHL

1MHz

500ns

2.0ns

Input Pulse Definition

VCC

Family

74ALS

D.U.T.

PULSE

GENERATOR

VIN

VOUT

Test Circuit for Totem-pole Outputs

DEFINITIONS:

RL = Load resistor;

see AC electrical characteristics for value.

CL = Load capacitance includes jig and probe capacitance;

see AC electrical characteristics for value.

RT = Termination resistance should be equal to ZOUT of

pulse generators.

tTHL (tf )

tTLH (tr )

AMP (V)

Amplitude

3.5V

1.3V

SC00005

74ALS00AD Datenblatt(PDF) 4 Page - NXP Semiconductors

74ALS00AD Datenblatt(HTML) 4 Page - NXP Semiconductors

Html Pages

1 2 3 4 5 6 7 8

Datenblatt Download

Link URL