| Datenblatt-Suchmaschine für elektronische Bauteile |
|
A5M20TG042T1 Datenblatt(PDF) 7 Page - NXP Semiconductors |
|
|
|||||||||||||||||||||||||||||
A5M20TG042T1 Datenblatt(HTML) 7 Page - NXP Semiconductors |
|
7 / 21 page ![]() NXP Semiconductors A5M20TG042 Airfast Power Amplifier Module A5M20TG042 All information provided in this document is subject to legal disclaimers. © 2024 NXP B.V. All rights reserved. Product data sheet Rev. 1 — 20 May 2024 7 / 21 13.3 Functional tests Table 12. Functional tests — 1805 MHz (In NXP production test fixture, TA = 25°C unless otherwise noted)[1] VD1 + VD2 = 28 Vdc, VD3A = VD3B = 45 Vdc, IDQ1 = 25 mA, IDQ2 = 65 mA, IDQ3A = 75 mA, VG3B = (VBIAS – 2.05)[2] Vdc, Pout = 16 W Avg., 1-tone CW, f = 1805 MHz. Characteristic Symbol Min Typ Max Unit Gain G 45.0 48.1 — dB Power added efficiency PAE 34.0 40.9 — % Saturated power[3] (Pulsed CW, 5% duty cycle) Psat 49.0 51.0 — dBm [1] Part input and output matched to 50 ohms. [2] Increase VG3B (peaking side) until IDQ3B = 50 mA current is attained, and then subtract 2.05 V for final VG3B bias voltage. [3] Psat is defined at P3dB compression point. Table 13. Functional tests — 2200 MHz (In NXP production test fixture, TA = 25°C unless otherwise noted)[1] VD1 + VD2 = 28 Vdc, VD3A = VD3B = 45 Vdc, IDQ1 = 25 mA, IDQ2 = 65 mA, IDQ3A = 75 mA, VG3B = (VBIAS – 2.05)[2] Vdc, Pout = 16 W Avg., 1-tone CW, f = 2200 MHz. Characteristic Symbol Min Typ Max Unit Gain G 44.5 48.1 — dB Power added efficiency PAE 34.0 41.6 — % Saturated power[3] (Pulsed CW, 5% duty cycle) Psat 48.0 50.0 — dBm [1] Part input and output matched to 50 ohms. [2] Increase VG3B (peaking side) until IDQ3B = 50 mA current is attained, and then subtract 2.05 V for final VG3B bias voltage. [3] Psat is defined at P3dB compression point. 13.4 Wideband ruggedness Table 14. Wideband ruggedness (In NXP reference circuit, TA = 25°C unless otherwise noted)[1] IDQ1 = 25 mA, IDQ2 = 65 mA, IDQ3A = 75 mA, VG3B = (VBIAS – 2.05)[2] Vdc, f = 2000 MHz, Additive White Gaussian Noise (AWGN) with 10 dB PAR. Characteristic Test results ISBW of 400 MHz at VDD3A = VDD3B = 55 Vdc, 3 dB input overdrive from 16 W Avg. modulated output power No device degradation [1] All data measured with device soldered to NXP reference circuit. [2] Increase VG3B (peaking side) until IDQ3B = 50 mA current is attained, and then subtract 2.05 V for final VG3B bias voltage. |
|
|
Link URL |
| War ALLDATASHEET hilfreich? [ DONATE ] |
Über Alldatasheet | Werbung | Kontakt | Privatsphäre und Datenschutz | Link zum Datenblatt | Linktausch | Hersteller All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |