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A5M20TG042T1 Datenblatt(PDF) 7 Page - NXP Semiconductors

Teilenummer A5M20TG042T1
Bauteilbeschribung  Airfast Power Amplifier Module
PDF  21 Pages
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Hersteller  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

A5M20TG042T1 Datenblatt(HTML) 7 Page - NXP Semiconductors

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NXP Semiconductors
A5M20TG042
Airfast Power Amplifier Module
A5M20TG042
All information provided in this document is subject to legal disclaimers.
© 2024 NXP B.V. All rights reserved.
Product data sheet
Rev. 1 — 20 May 2024
7 / 21
13.3 Functional tests
Table 12. Functional tests — 1805 MHz
(In NXP production test fixture, TA = 25°C unless otherwise noted)[1] VD1 + VD2 = 28 Vdc, VD3A = VD3B = 45 Vdc, IDQ1 = 25 mA,
IDQ2 = 65 mA, IDQ3A = 75 mA, VG3B = (VBIAS – 2.05)[2] Vdc, Pout = 16 W Avg., 1-tone CW, f = 1805 MHz.
Characteristic
Symbol
Min
Typ
Max
Unit
Gain
G
45.0
48.1
—
dB
Power added efficiency
PAE
34.0
40.9
—
%
Saturated power[3]
(Pulsed CW, 5% duty cycle)
Psat
49.0
51.0
—
dBm
[1] Part input and output matched to 50 ohms.
[2] Increase VG3B (peaking side) until IDQ3B = 50 mA current is attained, and then subtract 2.05 V for final VG3B bias voltage.
[3] Psat is defined at P3dB compression point.
Table 13. Functional tests — 2200 MHz
(In NXP production test fixture, TA = 25°C unless otherwise noted)[1] VD1 + VD2 = 28 Vdc, VD3A = VD3B = 45 Vdc, IDQ1 = 25 mA,
IDQ2 = 65 mA, IDQ3A = 75 mA, VG3B = (VBIAS – 2.05)[2] Vdc, Pout = 16 W Avg., 1-tone CW, f = 2200 MHz.
Characteristic
Symbol
Min
Typ
Max
Unit
Gain
G
44.5
48.1
—
dB
Power added efficiency
PAE
34.0
41.6
—
%
Saturated power[3]
(Pulsed CW, 5% duty cycle)
Psat
48.0
50.0
—
dBm
[1] Part input and output matched to 50 ohms.
[2] Increase VG3B (peaking side) until IDQ3B = 50 mA current is attained, and then subtract 2.05 V for final VG3B bias voltage.
[3] Psat is defined at P3dB compression point.
13.4 Wideband ruggedness
Table 14. Wideband ruggedness
(In NXP reference circuit, TA = 25°C unless otherwise noted)[1] IDQ1 = 25 mA, IDQ2 = 65 mA, IDQ3A = 75 mA,
VG3B = (VBIAS – 2.05)[2] Vdc, f = 2000 MHz, Additive White Gaussian Noise (AWGN) with 10 dB PAR.
Characteristic
Test results
ISBW of 400 MHz at VDD3A = VDD3B = 55 Vdc, 3 dB input
overdrive from 16 W Avg. modulated output power
No device degradation
[1] All data measured with device soldered to NXP reference circuit.
[2] Increase VG3B (peaking side) until IDQ3B = 50 mA current is attained, and then subtract 2.05 V for final VG3B bias voltage.



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