At TA = 25°C and V+ = 1.4V to 3.6V, unless otherwise noted

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

IQ

Average quiescent current

Serial bus inactive, CR1 =

0, CR0 = 1

3.2

5

µA

Serial bus inactive, CR1 =

1, CR0 = 0 (default)

4.8

7.5

Serial bus active, SCL

frequency = 400kHz

10

Serial bus active, SCL

frequency = 1MHz

18

Serial bus active, SCL

frequency = 2.85 MHz

40

ISD

Shutdown current

Serial bus inactive

0.15

0.35

µA

Serial bus active, SCL

frequency = 400kHz

5.5

Serial bus active, SCL

frequency = 1MHz

13

Serial bus active, SCL

frequency = 2.85MHz

35

(1)

Long-term drift is determined using accelerated operational life testing at a junction temperature of 150°C for 1000 hours.

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SBOS473L – MARCH 2009 – REVISED JULY 2024

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