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P4C1048L-55SC Datenblatt(PDF) 7 Page - Pyramid Semiconductor Corporation

Teilenummer P4C1048L-55SC
Bauteilbeschribung  LOW POWER 512K x 8 CMOS STATIC RAM
PDF  12 Pages
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Hersteller  PYRAMID [Pyramid Semiconductor Corporation]
Direct Link  http://www.pyramidsemiconductor.com
Logo PYRAMID - Pyramid Semiconductor Corporation

P4C1048L-55SC Datenblatt(HTML) 7 Page - Pyramid Semiconductor Corporation

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P4C1048L
Page 7 of 12
Document # SRAM129 REV D
Write
Active
Read
TIMING WAVEFORM OF WRITE CYCLE NO.2 (
CE
CE
CE
CE
CE CONTROLLED)(6)
* including scope and test fixture.
Note:
Because of the high speed of the P4C1048L, care must be taken when
testing this device; an inadequate setup can cause a normal functioning
part to be rejected as faulty. Long high-inductance leads that cause
supply bounce must be avoided by bringing the V
CC and ground planes
directly up to the contactor fingers. A 0.01 µF high frequency capacitor
is also required between V
CC and ground.
To avoid signal reflections, proper termination must be used; for example,
a 50
Ω test environment should be terminated into a 50Ω load with 1.77V
(Thevenin Voltage) at the comparator input, and a 589
Ω resistor must be
used in series with D
OUT to match 639Ω (Thevenin Resistance).
AC TEST CONDITIONS
TRUTH TABLE
Input Pulse Levels
Input Rise and Fall Times
Input Timing Reference Level
Output Timing Reference Level
Output Load
GND to 3.0V
3ns
1.5V
1.5V
See Fig. 1 and 2
Mode
Standby
D
OUT Disabled
Standby
Power
I/O
WE
WE
WE
WE
WE
OE
OE
OE
OE
OE
CE
CE
CE
CE
CE
High Z
D
OUT
D
IN
X
H
H
L
X
H
L
X
H
L
L
L
Active
Active
High Z
Figure 1. Output Load
Figure 2. Thevenin Equivalent



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