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TMXW330 Datenblatt(PDF) 7 Page - Rakon Limited

Teilenummer TMXW330
Bauteilbeschribung  SAW Bandpass Filters | Wireless Communications
PDF  7 Pages
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Hersteller  RAKON [Rakon Limited]
Direct Link  https://www.rakon.com/
Logo RAKON - Rakon Limited

TMXW330 Datenblatt(HTML) 7 Page - Rakon Limited

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TMX W330
SAW Bandpass Filters | Wireless Communications
Issue: Rev 6, 23 December 2022
Specifications are subject to change without notice
Copyright © 2020 to 2022 Rakon Limited. All rights reserved
Page 6 of 6
www.rakonxpress.com
Reliability Test
Parameter
Test condition / Description
Thermal Shock
The components shall remain within the electrical specifications after being kept at the condition of heat
cycle conditions: TA=-40°C ±3°C, TB=85°C ±2°C, t1=t2=30min, switch time ≤3min & cycle time:
100 times, recovery time: 2h±0.5h.
Temperature Storage
High Temperature Storage: The components shall remain within the electrical specifications after being
kept at the 85°C ±2°C for 500 hours, recovery time: 2h ±0.5h.
Low Temperature Storage: The components shall remain within the electrical specifications after being
kept at the -40°C ±3°C for 500 hours, recovery time: 2h ±0.5h.
Humidity test
The components shall remain within the electrical specifications after being kept at the condition of
ambient temperature 60°C ±2°C, and 90~95% RH for 500 hours.
Drop test
The components shall remain within the electrical specifications after random free drops 10 times from
height of 1.0 meter onto concrete floor, and the specimens shall meet the electrical specifications.
Vibration Fatigue
The components shall remain within the electrical specifications after loaded vibration at 10~55Hz,
amplitude 1.5mm, X, Y, Z, direction, during 2 hours.
Mechanical Shock
The components shall remain within the electrical specifications after 1000 shocks, acceleration 392
m/s2 , duration 6ms.
Note
As a result of the particularity of inner structure of SAW products, the components can easily be
breakdown by electrostatic shock; so it’s mandatory to pay attention to ESD protect during the tests.



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