| Datenblatt-Suchmaschine für elektronische Bauteile |
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SC1102CS.TR Datenblatt(PDF) 2 Page - Semtech Corporation |
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SC1102CS.TR Datenblatt(HTML) 2 Page - Semtech Corporation |
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2 / 12 page ![]() 2 2006 Semtech Corp. www.semtech.com POWER MANAGEMENT SC1102/SC1102A Electrical Characteristics Absolute Maximum Ratings r e t e m a r a Pl o b m y Sm u m i x a Ms t i n U D N G o t L T S B , C C VV N I 4 1 o t 0 . 1 -V D N G o t D N G P 5 . 0 ±V D N G o t E S A H P ) 1 ( 8 1 o t 5 . 0 -V E S A H P o t H T S B 4 1V e s a C o t n o it c n u J e c n a t s i s e R l a m r e h T θ C J 5 4W / C ° t n e i b m A o t n o it c n u J e c n a t s i s e R l a m r e h T θ A J 5 1 1W / C ° e g n a R e r u t a r e p m e T g n it a r e p OT A 0 7 o t 0C ° e r u t a r e p m e T n o it c n u J m u m i x a MT J 5 2 1C ° e g n a R e r u t a r e p m e T e g a r o t ST G T S 0 5 1 + o t 5 6 -C ° . c e S 0 1 ) g n ir e d l o S ( e r u t a r e p m e T d a e LT D A E L 0 0 3C ° Unless specified: V CC = 4.75V to 12.6V; GND = PGND = 0V; FB = VO; VBSTL = 12V; VBSTH-PHASE = 12V; TJ = 25 o C r e t e m a r a Ps n o i t i d n o Cn i Mp y Tx a Ms t i n U y l p p u S r e w o P e g a tl o V y l p p u SC C V2 . 46 . 2 1V t n e r r u C y l p p u SC C V = N E6 0 1A m n o it a l u g e R e n i LV 5 . 2 = O V5 . 0% r e i f il p m A r o r r E ) L O A ( n i a G 5 3B d s a i B t u p n I 58 A µ r o t a ll i c s O y c n e u q e r F r o t a ll i c s O2 0 1 1 C S0 7 10 0 20 3 2z H k A 2 0 1 1 C S5 2 40 0 55 7 5 e l c y C y t u D x a M r o t a ll i c s O0 95 9% s r e v i r D T E F S O M k n i S / e c r u o S H D, V 5 . 4 = H D - H T S B V 2 = E S A H P - H D 1A k n i S / e c r u o S L D. V 5 . 4 = L D - L T S B V 2 = . D N G P - L D 1A Note: (1) -1.5V to 20V for 25ns repetitive every cycle. Exceeding the specifications below may result in permanent damage to the device, or device malfunction. Operation outside of the parameters specified in the Electrical Characteristics section is not implied. Exposure to Absolute Maximum rated conditions for extended periods of time may affect device reliability. |
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