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SN74LVC2GU04DBVT Datenblatt(PDF) 1 Page - Texas Instruments |
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SN74LVC2GU04DBVT Datenblatt(HTML) 1 Page - Texas Instruments |
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1 / 20 page ![]() Seemechanicaldrawingsfordimensions. DBVPACKAGE (TOP VIEW) DCKPACKAGE (TOP VIEW) 2 GND V CC 5 3 4 2A 2Y 6 1 1A 1Y 3 4 2A 2 GND 2Y 5 1 1A V CC 6 1Y YZP PACKAGE (BOTTOMVIEW) 2 GND V CC 1 5 1A 2A 4 3 2Y 6 1Y SN74LVC2GU04 www.ti.com SCES197N – APRIL 1999 – REVISED DECEMBER 2013 Dual Inverter Gate Check for Samples: SN74LVC2GU04 1 FEATURES DESCRIPTION This dual inverter is designed for 1.65-V to 5.5-V VCC 2 • Available in the Texas Instruments NanoFree™ operation. Package The SN74LVC2GU04 device contains two inverters • Supports 5-V VCC Operation with unbuffered outputs and performs the Boolean • Inputs Accept Voltages to 5.5 V function Y = A. • Max tpd of 3.7 ns at 3.3 V NanoFree™ package technology is a major • Low Power Consumption, 10-µA Max ICC breakthrough in IC packaging concepts, using the die • ±24-mA Output Drive at 3.3 V as the package. • Typical VOLP (Output Ground Bounce) <0.8 V at VCC = 3.3 V, TA = 25°C • Typical VOHV (Output VOH Undershoot) >2 V at VCC = 3.3 V, TA = 25°C • Ioff Supports Live Insertion, Partial-Power- Down Mode, and Back-Drive Protection • Can Be Used as a Down Translator to Translate Inputs From a Max of 5.5 V Down to the VCC Level • Unbuffered Outputs • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II • ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) – 1000-V Charged-Device Model (C101) 1 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. 2 NanoFree is a trademark of Texas Instruments. PRODUCTION DATA information is current as of publication date. Copyright © 1999–2013, Texas Instruments Incorporated Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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