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HCF4010 Datenblatt(PDF) 7 Page - STMicroelectronics |
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HCF4010 Datenblatt(HTML) 7 Page - STMicroelectronics |
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7 / 13 page ![]() DocID8190 Rev 8 7/13 HCF4010 Electrical characteristics 13 Figure 3. Test circuit 1. CL = 50 pF or equivalent (includes jig and probe capacitance). 2. RL = 200 kΩ. 3. RT = ZOUT of pulse generator (typically 50 Ω). Table 7. Dynamic electrical characteristics (Tamb = 25 °C, CL = 50 pF, RL = 200 kΩ, tr = tf = 20 ns) Symbol Parameter Test condition Value(1) Unit VDD (V) VI (V) VCC (V) Min. Typ. Max. tTLH Output transition time 5 5 5 150 350 ns 10 10 10 75 15 15 15 15 55 110 tTHL Output transition time 55 5 35 70 10 10 10 20 40 15 15 15 15 30 tPLH Propagation delay time 5 5 5 100 200 10 10 10 50 100 10 10 5 50 100 15 15 15 35 70 15 15 5 35 70 tPHL Propagation delay time 5 5 5 65 130 10 10 10 35 70 10 10 5 30 70 15 15 15 25 50 15 15 5 20 40 1. Typical temperature coefficient for all VDD values is 0.3%/°C. |
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