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ISB35166 Datenblatt(PDF) 9 Page - STMicroelectronics |
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ISB35166 Datenblatt(HTML) 9 Page - STMicroelectronics |
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9 / 15 page ![]() EVALUATION DEVICE An evaluation device is used to demonstrate the performance of the ISB35000 series as well as verify the effectiveness of the design system. The device has path delays, latches, a host of macro- cells and embedded functions which were used to verify the simulated characteristics that are supplied in the data book. Characterization of the path delays including interconnect shows typical delays of 210 ps for a 2 input NAND with receivers/drivers oper- ating at frequencies of 200 MHz. The evaluation device is available in a 208 pin plastic quad flat pack. Figure 5. Evaluation Device ISB35000 SERIES 9/15 |
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