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AP20N03D Datenblatt(PDF) 2 Page - A POWER MICROELECTRONICS

Teilenummer AP20N03D
Bauteilbeschribung  30V N-Channel Enhancement Mode MOSFET
PDF  9 Pages
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AP20N03D
30V N-Channel Enhancement Mode MOSFET
AP20N03D Rve3.9
臺灣永源微電子科技有限公司
Electrical Characteristics (TJ=25℃, unless otherwise noted)
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Unit
BVDSS
Drain-Source Breakdown Voltage
VGS=0V , ID=250uA
30
32
---
V
△BVDSS/△TJ BVDSS Temperature Coefficient
Reference to 25
℃ , ID=1mA
---
0.023
---
V/
RDS(ON)
Static Drain-Source On-Resistance2
VGS=10V , ID=10A
---
15.6
25
VGS=4.5V , ID=8A
---
28.5
38
VGS(th)
Gate Threshold Voltage
VGS=VDS , ID =250uA
1.2
1.6
2.5
V
△VGS(th)
VGS(th) Temperature Coefficient
---
-4.2
---
mV/
IDSS
Drain-Source Leakage Current
VDS=24V , VGS=0V , TJ=25
---
---
1
uA
VDS=24V , VGS=0V , TJ=55
---
---
5
IGSS
Gate-Source Leakage Current
VGS=±20V , VDS=0V
---
---
±100
nA
gfs
Forward Transconductance
VDS=5V , ID=10A
---
5.5
---
S
Rg
Gate Resistance
VDS=0V , VGS=0V , f=1MHz
---
2.3
---
Ω
Qg
Total Gate Charge (4.5V)
VDS=15V , VGS=4.5V , ID=10A
---
4.9
---
nC
Qgs
Gate-Source Charge
---
1.66
---
Qgd
Gate-Drain Charge
---
1.85
---
Td(on)
Turn-On Delay Time
VDD=15V , VGS=10V , RG=3.3
ID=10A
---
1.6
---
ns
Tr
Rise Time
---
15.8
---
Td(off)
Turn-Off Delay Time
---
13
---
Tf
Fall Time
---
4.8
---
Ciss
Input Capacitance
VDS=15V , VGS=0V , f=1MHz
---
216
---
pF
Coss
Output Capacitance
---
62
---
Crss
Reverse Transfer Capacitance
---
51
---
IS
Continuous Source Current1,5
VG=VD=0V , Force Current
---
---
24
A
ISM
Pulsed Source Current2,5
---
---
50
A
VSD
Diode Forward Voltage2
VGS=0V , IS=1A , TJ=25
---
---
1.2
V
trr
Reverse Recovery Time
IF=10A , dI/dt=100A/µs ,
TJ=25
---
8.7
---
nS
Qrr
Reverse Recovery Charge
---
1.95
---
nC
Note :
1.The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
2.The data tested by pulsed , pulse width ≦ 300us , duty cycle ≦ 2%
3.The EAS data shows Max. rating . The test condition is VDD=25V,VGS=10V,L=0.1mH,IAS=12.7A
4.The power dissipation is limited by 150℃ junction temperature
5.The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation.



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