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M39208 Datenblatt(PDF) 24 Page - STMicroelectronics |
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M39208 Datenblatt(HTML) 24 Page - STMicroelectronics |
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24 / 30 page ![]() Symbol Test Conditions Parameter M39208 Unit -100 -120 -150 Min Max Min Max Min Max tWHQ7V1 EF = 0 EE = 1 Write Enable High to DQ7 Valid (Program, W Controlled) 10 10 10 µs tWHQ7V2 EF = 0 EE = 1 Write Enable High to DQ7 Valid (Sector Erase, W Controlled) 1.5 30 1.5 30 1.5 30 sec tEHQ7V1 EF = 0 EE = 1 Flash Block Enable High to DQ7 Valid (Program, EF Controlled) 10 10 10 µs tEHQ7V2 EF = 0 EE = 1 Flash Block Enable High to DQ7 Valid (Sector Erase, EF Controlled) 1.5 30 1.5 30 1.5 30 sec tQ7VQV EF = 0 EE = 1 Q7 Valid to Output Valid (Data Polling) 40 50 55 ns Notes: 1. All other timings are defined in Read AC Characteristics table. Table 16. Data Polling and Toggle Bit AC Characteristics (1) (TA = 0 to 70 °C or –20 to 85°C or –40 to 85°C; VCC = 2.7 V to 3.6V) Parameter M39208 Unit Min Typ Max Chip Program (Byte) 8 sec Chip Erase (Preprogrammed) 3 30 sec Chip Erase 10 sec Sector Erase (Preprogrammed) 1 30 sec Sector Erase 2 sec Byte Program 10 µs Program/Erase Cycles (per Sector) 100,000 cycles Table 17. Program, Erase Times and Program, Erase Endurance Cycles (Flash Block) (TA = 0 to 70 °C or –20 to 85°C or –40 to 85°C; VCC = 2.7 V to 3.6V) 24/30 M39208 |
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