| Datenblatt-Suchmaschine für elektronische Bauteile |
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653 Datenblatt(PDF) 11 Page - Nexperia B.V. All rights reserved |
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653 Datenblatt(HTML) 11 Page - Nexperia B.V. All rights reserved |
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11 / 19 page ![]() 74HC_HCT238 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2016. All rights reserved. Product data sheet Rev. 4 — 27 January 2016 11 of 19 NXP Semiconductors 74HC238; 74HCT238 3-to-8 line decoder/demultiplexer Test data is given in Table 9. Definitions for test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch Fig 8. Test circuit for measuring switching times Table 9. Test data Type Input Load S1 position VI tr, tf CL RL tPHL, tPLH 74HC238 VCC 6ns 15pF, 50 pF 1k open 74HCT238 3V 6ns 15pF, 50 pF 1k open |
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