SMP100-8 datasheet(5/9 Pages) STMICROELECTRONICS

Teilenummer	SMP100-8

Bauteilbeschribung	COMMUNICATION EQUIPMENT PROTECTION: TRISIL TM

PDF	9 Pages

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Hersteller	STMICROELECTRONICS [STMicroelectronics]

Direct Link	http://www.st.com

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TEST CIRCUIT 2 for IH parameter.

-VP

VBAT = - 48 V

Surge generator

D.U.T.

This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit.

TEST PROCEDURE :

- Adjust the current level at the IH value by short circuiting the D.U.T.

- Fire the D.U.T. with a surge current : Ipp = 10A, 10/1000

µs.

- The D.U.T. will come back to the off-state within 50 ms max.

100 V /

µs, di/dt < 10 A / µs, Ipp = 100 A

1kV /

µs, di/dt < 10 A / µs, Ipp = 10 A

µF

Ω

470

Ω

0.36 nF

µH

µF

µH

Ω

250

Ω

µH

Ω

KeyTek ’System 2’ generator with PN246I module

TEST CIRCUITS 3 FOR VBO DYNAMIC PARAMETERS

SMP100-xxx

5/9

SMP100-8 Datenblatt(PDF) 5 Page - STMicroelectronics