| Datenblatt-Suchmaschine für elektronische Bauteile |
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STTH1R04Q Datenblatt(PDF) 4 Page - STMicroelectronics |
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STTH1R04Q Datenblatt(HTML) 4 Page - STMicroelectronics |
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4 / 10 page ![]() Characteristics STTH1R04 4/10 Figure 5. Relative variation of thermal impedance junction to lead versus pulse duration, SMA Figure 6. Relative variation of thermal impedance junction to lead versus pulse duration, SMB 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.E-02 1.E-01 1.E+00 1.E+01 1.E+02 1.E+03 Z th(j-l)/Rth(j-l) Single pulse SMA S cu=1cm² tP(s) 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.E-03 1.E-02 1.E-01 1.E+00 1.E+01 1.E+02 1.E+03 Zth(j-l)/Rth(j-l) Single pulse SMB Scu=1cm² tP(s) Figure 7. Junction capacitance versus reverse voltage applied (typical values) Figure 8. Reverse recovery charges versus dIF/dt (typical values) 1 10 100 1 10 100 1000 C(pF) F=1MHz V OSC=30mVRMS T j=25°C VR(V) 0 4 8 12 16 20 24 28 32 36 40 10 100 1000 Q RR(nC) I F= 1 A V R=320 V T j=125 °C T j=25 °C dIF/dt(A/µs) Figure 9. Reverse recovery time versus dIF/dt (typical values) Figure 10. Peak reverse recovery current versus dIF/dt (typical values) 0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 10 100 1000 t RR(ns) I F= 1 A V R=320 V T j=125 °C T j=25 °C dIF/dt(A/µs) 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 10 100 1000 I RM(A) I F= 1 A V R=320 V T j=125 °C T j=25 °C dIF/dt(A/µs) |
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