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Datenblatt-Suchmaschine für elektronische Bauteile |
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Datenblatt-Suchmaschine für elektronische Bauteile |
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LRIS2K Datenblatt(PDF) 89 Page - STMicroelectronics |
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LRIS2K Datenblatt(HTML) 89 Page - STMicroelectronics |
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89 / 102 page  LRIS2K Maximum rating 89/102 45 Maximum rating Stressing the device above the rating listed in the absolute maximum ratings table may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. Table 91. Absolute maximum ratings Symbol Parameter Min. Max. Unit TSTG, hSTG, tSTG Storage conditions Wafer 15 25 °C 23 months kept in its antistatic bag A1, A6, A7 15 25 °C 40% 60% RH 2years ICC Supply current on AC0 / AC1 –20 20 mA VMAX Input voltage on AC0 / AC1 –7 7 V VESD Electrostatic discharge voltage(1) (2) 1. Mil. Std. 883 - Method 3015. 2. ESD test: ISO10373-7 specification. A1, A6, A7 –7000 7000 V MLP (HBM) –1000 1000 V MLP (MM) –100 100 V |
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