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TS5071N Datenblatt(PDF) 27 Page - STMicroelectronics |
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TS5071N Datenblatt(HTML) 27 Page - STMicroelectronics |
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27 / 32 page ![]() DISTORTION Symbol Parameter Min. Typ. Max. Unit STDX Signal to Total Distortion Transmit Sinusoidal Test Method Half Channel Level = 3dBm0 Level = -30dBm0 to 0dBm0 Level = -40dBm0 Level = -45dBm0 33 36 30 25 dBp dBp dBp dBp STDR Signal to Total Distortion Receive Sinusoidal Test Method Half Channel Level = 3dBm0 Level = -30dBm0 to 0dBm0 Level = -40dBm0 Level = -45dBm0 33 36 30 25 dBp dBp dBp dBp SFDX Single Frequency Distortion Transmit -46 dB SFDR Single Frequency Distortion Receive -46 dB IMD Intermodulation Distortion Transmit or Receive Two Frequencies in the Range 300Hz to 3400Hz -41 dB CROSSTALK Symbol Parameter Min. Typ. Max. Unit CTX-R Transmit to Receive Crosstalk, 0dBm0 Transmit Level f = 300 to 3400Hz DR = Idle PCM Code -90 -75 dB CTR-X Receive to Transmit Crosstalk, 0dBm0 Receive Level f = 300 to 3400Hz (note 4) -90 -70 dB Notes: 1. Applies only to MCLK frequencies ≥ 1.536 MHz. At 512 kHz A 50:50 ± 2 % duty cycle must be used. 2. A multi-tone test technique is used (peak/rms ≤ 9.5 dB). 3. Measured by grounded input at VFXI. 4. PPSRX, NPSRX and CTR-X are measured with a – 50 dBm0 activation signal applied to VFXI. A signal is Valid if it is above VIH or below VIL and invalid if it is between VIL and VIH. For the purpose of the specification the following conditions apply : a) All input signals are defined as VIL = 0.4 V, VIH = 2.7 V, tR < 10 ns, tF 10 ns b) tR is measured from VIL to VIH,tF is measured from VIH to VIL c) Delay Times are measured from the input signal Valid to the clock input invalid d) Setup Times are measured from the data input Valid to the clock input invalid e) Hold Times are measured from the clock signal Valid to the data input invalid f) Pulse widths are measured from VIL to VIL or from VIH to VIH TS5070 - TS5071 27/32 |
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