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SSG4407 Datenblatt(PDF) 2 Page - SeCoS Halbleitertechnologie GmbH |
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SSG4407 Datenblatt(HTML) 2 Page - SeCoS Halbleitertechnologie GmbH |
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2 / 4 page ![]() http://www.SeCoSGmbH.com/ Any changing of specification will not be informed individual 01-Jun-2002 Rev. A Page 2 of 4 Notes: 1. 2.Pulse width 300us, dutycycle 2%. ≦ ≦ 3.Surface mounted on 1 in copper pad of FR4 board;125 C/W when mounted on min. copper pad. 2 o Max. Typ. Test Condition Unit nC nS 31 25 10.7 =-10.7 =- A, VGS=0V. _ IS V -1.2 _ _ IS A, VGS=0V. dl/dt=100A/us Parameter Symbol Min. Forward On Voltage Reverse Recovery Time Trr _ Reverse Recovery Change _ Qrr VSD _ 2 370 f=1.0MHz 13 S VDS=-10V, ID=-10A _ _ _ _ 29 6 14 15 12 100 70 2600 500 nC nS pF VGS=0V VDS=-25V VDD=-15V ID=-1A VGS=-10V RG=3.3 RD=15 Ω Ω ID=-10.7A VDS=-24V VGS=-4.5V _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ 14 20 mΩ VGS=-10V, ID=-10A VGS=-4.5V, ID=-5A _ _ 46 4100 _ _ Crss Gfs Reverse Transfer Capacitance Forward Transconductance Qg Qgs Qgd Td(ON) Td(Off) Tr Ciss Coss Tf RDS(ON) 30 0.015 1.0 -3.0 100 -1 -25 ± V V/ Reference to 25C, ID=-1mA o oC V nA uA uA VGS=0V, ID=-250uA VGS= 25V ± VDS=-30V,VGS=0 VDS=-24V,VGS=0 VDS=VGS, ID=-250uA _ _ _ _ _ _ _ _ _ _ _ - - - Total Gate Charge Gate-Source Charge Gate-Drain ("Miller") Charge Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Input Capacitance Output Capacitance BVDSS BVDS/ Tj IDSS Drain-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Gate Threshold Voltage Gate-Source Leakage Current Drain-Source Leakage Current (Tj=25 ) Static Drain-Source On-Resistance Drain-Source Leakage Current(Tj= 70 ) VGS(th) IGSS oC oC 2 2 2 Source-Drain Diode Parameter Symbol Max. Typ. Test Condition Min. Unit Electrical Characteristics( Tj=25 C Unless otherwise specified) o Pulse width limited by Max. junction temperature. Elektronische Bauelemente SS G4407 -10.7A, -30V,RDS(ON) 14m P-Channel Enhancement Mode Power Mos.FET Ω |
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