KH205AM datasheet(6/7 Pages) CADEKA

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DATA SHEET

KH205

REV. 1A January 2004

where:

s IP3

o = third-order output intercept, dBm at

the load.

s P

o = output power level, dBm at the load.

s HD3rd = third-order distortion from the

fundamental, -dBc.

s dBm is the power in mW, at the load,

expressed in dB.

Realized

third-order

output

distortion

highly

dependent upon the external circuit.

Some of the

common external circuit choices that improve 3rd order

distortion are:

s short and equal return paths from the load

to the supplies.

s de-coupling capacitors of the correct value.

s higher load resistance.

s a lower ratio of the output swing to the

power supply voltage.

Printed Circuit Layout

As with any high frequency device, a good PCB layout

will enhance the performance of the KH205. Good

ground plane construction and power supply bypassing

close to the package are critical to achieving full perfor-

mance. In the non-inverting configuration, the amplifier is

sensitive to stray capacitance to ground at the inverting

input. Hence, the inverting node connections should be

small with minimal stray capacitance to the ground plane

or other nodes. Shunt capacitance across the feedback

resistor should not be used to compensate for this effect.

General layout and supply bypassing play major roles in

high frequency performance. Follow the steps below as

a basis for high frequency layout:

s Include 6.8µF tantalum and 0.1µF ceramic

capacitors on both supplies.

s Place the 6.8µF capacitors within 0.75

inches of the power pins.

s Place the 0.1µF capacitors less than 0.1

inches from the power pins.

s Remove the ground plane under and

around the part, especially near the input

and output pins to reduce parasitic

capacitance.

s Minimize all trace lengths to reduce series

inductances.

s Use flush-mount printed circuit board pins

for prototyping, never use high profile DIP

sockets.

Evaluation PC boards (part number 730008 for inverting,

730009 for non-inverting) for the KH205 are available to

aid in device testing.

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