TLC352

LinCMOS

™ DUAL DIFFERENTIAL COMPARATOR

SLCS016 – SEPTEMBER 1985 – REVISED OCTOBER 1990

8

POST OFFICE BOX 655303

PARAMETER MEASUREMENT INFORMATION

Response time is defined as the interval between the application of an input step function and the instant when the

output reaches 50% of its maximum value. Response time, low-to-high-level output, is measured from the leading

edge of the input pulse, while response time, high-to-low level output, is measured from the trailing edge of the input

pulse. Response-time measurement at low input signal levels can be greatly affected by the input offset voltage. The

offset voltage should be balanced by the adjustment at the inverting input (as shown in Figure 3) so that the circuit

is just at the transition point. Then a low signal, for example 105-mV or 5-mV overdrive, causes the output to change

state.

10%

50%

50 %

Pulse Generator

VDD

10

Ω

10 Turn

1 V

–1 V

1 k

Ω

0.1 mF

CL

(see Note A)

1

µF

5.1 k

Ω

50

Ω

Input

Offset Voltage

Compensation

Adjustment

TEST CIRCUIT

tPLH

90%

10%

tPHL

tf

tr

90%

Input

Overdrive

Overdrive

Input

Low-to-High-

Level Output

High-to-Low-

Level Output

100 mV

100 mV

VOLTAGE WAVEFORMS

DUT

NOTE A: CL includes probe and jig capacitance.

Figure 3. Response, Rise, and Fall Times Circuit and Voltage Waveforms