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Datenblatt-Suchmaschine für elektronische Bauteile |
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Datenblatt-Suchmaschine für elektronische Bauteile |
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PCM5310PAP Datenblatt(PDF) 2 Page - Texas Instruments |
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PCM5310PAP Datenblatt(HTML) 2 Page - Texas Instruments |
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2 / 103 page  PACKAGING/ORDERING INFORMATION ABSOLUTE MAXIMUM RATINGS (1) RECOMMENDED OPERATING CONDITIONS PCM5310 SLES244 – FEBRUARY 2009 ............................................................................................................................................................................................ www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. Over operating free-air temperature range (unless otherwise noted). PARAMETER PCM5310 UNIT VCCDA, VCCAD, VCCP, VDD –0.3 to 4.0 V Supply voltage VCCH –0.3 to 10 V Ground voltage differences: AGNDAD, AGNDDA, PGND, HGND, DGND ±0.1 V Input voltage –0.3 to 4.0 V Input current (all pins except supplies) ±10 mA Ambient temperature under bias –40 to +125 °C Storage temperature –55 to +150 °C Junction temperature +150 °C Lead temperature (soldering, 5s) +260 °C Package temperature (IR reflow, peak) +260 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. Over operating free-air temperature range (unless otherwise noted). PARAMETER MIN NOM MAX UNIT Analog supply voltage, VCCAD, VCCDA, VCCP 3.0 3.3 3.6 V Analog supply voltage, VCCH 8.55 9 9.45 V Digital supply voltage, VDD 3.0 3.3 3.6 V Analog input voltage, full-scale (–0 dB) 2 VRMS Analog output voltage, full-scale (–0 dB) 2 2.4 VRMS Digital input logic family CMOS ADC system clock 4.096 36.864 MHz ADC sampling clock 32 96 kHz Digital input clock frequency DAC system clock 4.096 36.864 MHz DAC sampling clock 32 192 kHz Analog output load resistance 10 k Ω Analog output load capacitance 30 pF Digital output load capacitance 10 pF Operating free-air temperature, TA –25 +85 °C 2 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): PCM5310 |
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