• North America Tel: 800.366.2266 / Fax: 978.366.2266

• Europe Tel: 44.1908.574.200 / Fax: 44.1908.574.300

• Asia/Pacific Tel: 81.44.844.8296 / Fax: 81.44.844.8298

Visit www.macomtech.com for additional data sheets and product information.

M/A-COM Technology Solutions Inc. and its affiliates reserve the right to make

changes to the product(s) or information contained herein without notice.

5

High Power GaAs SPDT Switch

DC - 3.0 GHz

Rev. V3

SW-276

ADVANCED: Data Sheets contain information regarding a product M/A-COM Technology Solutions

is considering for development. Performance is based on target specifications, simulated results,

and/or prototype measurements. Commitment to develop is not guaranteed.

PRELIMINARY: Data Sheets contain information regarding a product M/A-COM Technology

Solutions has under development. Performance is based on engineering tests. Specifications are

typical. Mechanical outline has been fixed. Engineering samples and/or test data may be available.

Commitment to produce in volume is not guaranteed.

Table 1 - Screening

Test

Sample Size

Method/Condition

Internal Visual

11

1%

M/A-COM Workmanship Standard

Stabilization Bake

100%

1008/C, 150°C for 24 hours

Temperature Cycling

100%

1010/C, -65°C, 150°C

Constant Acceleration

100%

2001/A, 5000G, Y1 Plane only

Burn-In

12

100%

1015, 125°C for 160 hours

Final Electrical

100%

Product Data Sheet Guaranteed Parameters

Seal Test - Fine Leak

100%

1014/A

Seal Test - Gross Leak

100%

1014/C

External Visual

13

100%

M/A-COM Workmanship Standard

10. This test does not apply to connectorized units. Connectorized units using hermetically sealed hybrid microcircuits will be screened to

Table 1 at the hybrid level.

11. Sample size for internal visual will be per MIL-STD-105, AQL 1%.

12. Burn-in temperature will be reduced as necessary to keep the internal junction temperatures from exceeding their absolute maximum

ratings.

13. Parts will be marked with their standard marking, plus a screening date and “T1” to signify that they were screened.

Table B - Screening (Reference Document MIL-STD-883D), Includes 100% Internal Vis-

Test

Sample Size

Method/Condition

Internal Visual

100%

2017

Stabilization Bake

100%

1008/C, 150°C for 24 hours

Temperature Cycling

100%

1010/C, -65°C, 150°C

Constant Acceleration

100%

2001/A, 5000G, Y1 Plane only

Burn-In

14

100%

1015, 125°C for 160 hours

Final Electrical

100%

Product Data Sheet Guaranteed Parameters

Seal Test - Fine Leak

100%

1014/A

Seal Test - Gross Leak

100%

1014/C

External Visual

15

100%

2009

14. Burn-In temperature will be reduced as necessary to keep the internal junction temperatures from exceeding their absolute maximum

ratings.

15. Parts will be marked with their standard marking, plus a “B” suffix.