B32656S7684564 datasheet(17/31 Pages) EPCOS

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Technical data

Operating temperature range

Max. operating temperature Top,max

+110

°C

Upper category temperature Tmax

+100

°C

Lower category temperature Tmin

°C

Rated temperature TR

+85

°C

Dissipation factor tan

δ (in 10-3) at

≤0.1 µF

0.1

µF<C

≤1 µF

CR >1

µF

at 20

°C

1 kHz

0.5

(upper limit values)

10 kHz

0.8

1.5

100 kHz 5.0

Insulation resistance Rins

≤ 0.33 µF

CR > 0.33

µF

or time constant

τ = C

Rins

100 G

Ω

30000 s

at 20

°C, rel. humidity ≤ 65%

(minimum as-delivered values)

DC test voltage

1.6

VR, 2 s

Category voltage VC

TA (

°C)

DC voltage derating

AC voltage derating

(continuous operation with VDC TA

≤ 85

VC = VR

VC,RMS = VRMS

or VAC at f

≤ 1 kHz)

85<TA

≤100 V

C = VR

(165 TA)/80

VC,RMS=VRMS (165 TA)/80

Operating voltage Vop for

TA (

°C)

DC voltage (max. hours) AC voltage (max. hours)

short operating periods

≤ 85

Vop = 1.25 VC (2000 h) Vop = 1.0 VC,RMS (2000 h)

(VDC or VAC at f

≤ 1 kHz)

85<TA

≤100 V

op = 1.25

VC (1000 h) Vop = 1.0 VC,RMS (1000 h)

Damp heat test

56 days/40

°C/93% relative humidity

Limit values after damp

Capacitance change

∆C/C

≤ 3%

heat test

Dissipation factor change

∆ tan δ

≤ 0.5 10-3 (at 1 kHz)

≤ 1.0 10-3 (at 10 kHz)

Insulation resistance Rins

or time constant

τ = C

Rins

≥ 50% of minimum

as-delivered values

Reliability:

Failure rate

Service life tSL

1 fit (

≤ 1 10-9/h) at 0.5 V

R, 40

°C

200 000 h at 1.0

VR, 85

°C

For conversion to other operating conditions and temperatures,

refer to chapter "Quality, 2 Reliability".

Failure criteria:

Total failure

Short circuit or open circuit

Failure due to variation

Capacitance change

∆C/C

> 10%

of parameters

Dissipation factor tan

> 4

upper limit value

Insulation resistance Rins

or time constant

τ = C

Rins

< 1500 M

Ω (C

≤0.33 µF)

< 500 s (CR>0.33

µF)

B32656S

Snubber (wound)

Page 17 of 31

Please read Cautions and warnings and

Important notes at the end of this document.

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