Comparators

Monitor

Inputs

12-bit

200ksps,

ADC

(0.5% Int. Ref)

SEQUENCING ENGINE

BOOLEAN

Logic Builder

JTAG

Or

GPIO

I2C/PMBus

FLASH Memory

User Data, Fault

and Peak Logging

16

6

64-pin QFN

22

General Purpose I/O

(GPIO)

Digital Inputs (8 max)

Digital Outputs (16 max)

Rail Enables (16 max)

Margining Outputs (10 max)

Multi-phase PWM (8 max)

UCD90160

SLVSAC8A

– NOVEMBER 2010 – REVISED APRIL 2011

www.ti.com

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

FUNCTIONAL BLOCK DIAGRAM

ORDERING INFORMATION

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see

the TI Web site at www.ti.com.

ABSOLUTE MAXIMUM RATINGS

(1)

VALUE

UNIT

–0.3 to 3.8

V

–0.3 to 3.8

V

–0.3 to (V33A + 0.3)

V

–40 to 150

°C

Human-body model (HBM)

2.5

kV

ESD rating

Charged-device model (CDM)

750

V

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating

Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

2

Copyright

© 2010–2011, Texas Instruments Incorporated