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TS19371CX6RF Datenblatt(PDF) 2 Page - Taiwan Semiconductor Company, Ltd

Teilenummer TS19371CX6RF
Bauteilbeschribung  Boost (Step-up) WLED Driver with OVP
PDF  10 Pages
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Hersteller  TSC [Taiwan Semiconductor Company, Ltd]
Direct Link  http://www.taiwansemi.com
Logo TSC - Taiwan Semiconductor Company, Ltd

TS19371CX6RF Datenblatt(HTML) 2 Page - Taiwan Semiconductor Company, Ltd

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TS19371
Boost (Step-up) WLED Driver with OVP
2/10
Version: G08
Absolute Maximum Rating
Parameter
Symbol
Limit
Unit
Input Voltage
VIN
20
V
Supply Voltage (Recommended)
VIN
2.5 ~ 18
V
FB Voltage
VFB
10
V
SW Voltage
VSW
36
V
CTRL Voltage
VCTRL
10
V
Ambient Temperature Range
TA
-40 to +85
oC
Junction Temperature Range
TJ
-40 to +125
oC
Electrical Specifications (Ta = 25
oC, V
IN= VCTRL=3V, CIN=1uF, COUT=0.22uF unless otherwise noted)
Parameter
Symbol
Test Conditions
Min
Typ
Max
Units
Input Voltage Range
VIN
2.5
--
18
V
Feedback Voltage
VFB
ISW=180mA, Vin=5V
80
95
110
mV
FB Pin Bias Current
IB
10
45
100
nA
Supply Current
IQ
--
2.1
3.0
mA
CTRL = 0V
--
0.1
1.0
uA
Switching Frequency
FRSW
0.8
1.2
1.6
MHz
Switch Current Limit
ICL
--
650
--
mA
Maximum Duty Cycle
DTMX
85
90
--
%
Switch VCESAT
VSAT
At ISW = 250mA
--
350
--
mV
Switch Leakage Current
ILKG
VSW = 5V
--
0.01
5
µA
Voltage Enable Control
VCTL
High
1.5
--
--
V
Low
--
--
0.4
V
CTRL Pin Bias Current
ICTL
Ctrl = 2V
--
65
--
µA
Over Voltage Protection
OVP
--
30
--
V
Thermal Resistance -
Junction to Ambient
JA
SOT-26
--
220
--
°C/W
SOP-8 (Note 1)
--
70
--
Note 1: Surface mounted on 1” x 1” FR4 board
Note 2: Absolute maximum ratings are limits beyond which damage to the device may occur.
Note 3: The maximum allowable power dissipation is a function of maximum function temperature, TJ(max), the
junction to ambient thermal resistance, θJA, and the ambient temperature. The maximum allowable, power
dissipation at any ambient temperature is calculated using: PD(MAX)= [TJ(max)-TA]/θJA . Exceeding the maximum
allowable power dissipation will cause excessive die temperature. All limits at temperature extremes are
guaranteed via correlation using standard statistical methods



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