MC7800, MC7800A, LM340, LM340A Series

4

MOTOROLA ANALOG IC DEVICE DATA

MC7805AC/LM340AT–5

Characteristic

Symbol

Min

Typ

Max

Unit

Output Noise Voltage (TA = 25°C)

Vn

–

10

–

µV/VO

10 Hz

≤ f ≤ 100 kHz

Output Resistance (f = 1.0 kHz)

rO

–

0.9

–

m

Ω

Short Circuit Current Limit (TA = 25°C)

ISC

–

0.2

–

A

Vin = 35 Vdc

Peak Output Current (TJ = 25°C)

Imax

–

2.2

–

A

Average Temperature Coefficient of Output Voltage

TCVO

–

–0.3

–

mV/

°C

NOTES: 1. Tlow = –40°C for MC78XXAC, C, LM340AT–XX, LM340T–XX

Thigh = +125°C for MC78XXAC, C, LM340AT–XX, LM340T–XX

2. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account

separately. Pulse testing with low duty cycle is used.

MC7806C

Characteristic

Symbol

Min

Typ

Max

Unit

Output Voltage (TJ = 25°C)

VO

5.75

6.0

6.25

Vdc

Output Voltage (5.0 mA

≤ IO ≤ 1.0 A, PD ≤ 15 W)

VO

Vdc

8.0 Vdc

≤ Vin ≤ 21 Vdc

5.7

6.0

6.3

9.0 Vdc

≤ Vin ≤ 21 Vdc

–

–

–

Line Regulation, TJ = 25°C (Note 2)

Regline

mV

8.0 Vdc

≤ Vin ≤ 25 Vdc

–

0.5

24

9.0 Vdc

≤ Vin ≤ 13 Vdc

–

0.8

12

Load Regulation, TJ = 25°C (Note 2)

Regload

–

1.3

30

mV

5.0 mA

≤ IO ≤ 1.5 A

Quiescent Current (TJ = 25°C)

IB

–

3.3

8.0

mA

Quiescent Current Change

∆IB

mA

8.0 Vdc

≤ Vin ≤ 25 Vdc

–

0.3

1.3

5.0 mA

≤ IO ≤ 1.0 A

–

0.08

0.5

Ripple Rejection

RR

58

65

–

dB

9.0 Vdc

≤ Vin ≤ 19 Vdc, f = 120 Hz

Dropout Voltage (IO = 1.0 A, TJ = 25°C)

VI – VO

–

2.0

–

Vdc

Output Noise Voltage (TA = 25°C)

Vn

–

10

–

µV/VO

10 Hz

≤ f ≤ 100 kHz

Output Resistance f = 1.0 kHz

rO

–

0.9

–

m

Ω

Short Circuit Current Limit (TA = 25°C)

ISC

–

0.2

–

A

Vin = 35 Vdc

Peak Output Current (TJ = 25°C)

Imax

–

2.2

–

A

Average Temperature Coefficient of Output Voltage

TCVO

–

–0.3

–

mV/

°C

NOTES: 1. Tlow = –40°C for MC78XXAC, C

Thigh = +125°C for MC78XXAC, C

2. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account

separately. Pulse testing with low duty cycle is used.