SST30VR021 datasheet(4/12 Pages) SST

Teilenummer	SST30VR021

Bauteilbeschribung	2 Mbit ROM 1 Mbit / 2Mbit / 256 Kbit SRAM ROM/RAM Combo

PDF	12 Pages

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Hersteller	SST [Silicon Storage Technology, Inc]

Direct Link	http://www.sst.com/

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4 / 12 page

Data Sheet

2 Mbit ROM + 1 Mbit / 2Mbit / 256 Kbit SRAM

ROM/RAM Combo

SST30VR021 / SST30VR022 / SST30VR023

S71135-02-000

4/01

380

FIGURE 2: AC INPUT/OUTPUT REFERENCE WAVEFORMS

FIGURE 3: A TEST LOAD EXAMPLE

TABLE

4: CAPACITANCE (Ta = 25°C, f=1 Mhz)

Parameter

Description

Test Condition

Maximum

CI/O1

I/O Pin Capacitance

VI/O = 0V

8 pF

CIN1

Input Capacitance

VIN = 0V

6 pF

T4.1 380

1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.

380 ILL F08.0

REFERENCE POINTS

OUTPUT

INPUT

VIT

VIHT

VILT

VOT

AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points

for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10%

↔ 90%) are <5 ns.

Note: VIT - VINPUT Test

VOT - VOUTPUT Test

VIHT - VINPUT HIGH Test

VILT - VINPUT LOW Test

380 ILL F09.0

TO TESTER

TO DUT

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