| Datenblatt-Suchmaschine für elektronische Bauteile |
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ISO7240CF Datenblatt(PDF) 16 Page - Texas Instruments |
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ISO7240CF Datenblatt(HTML) 16 Page - Texas Instruments |
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16 / 31 page ![]() VCM IN OUT GND1 NOTE B S1 V or V OH OL VCC1 VCC2 C = 0.1 F± 1% m C = 0.1 F± 1% m GND2 Pass-fail criteria: Output must remain stable OUT Tektronix HFS9009 PATTERN GENERATOR IN DUT Tektronix 784D V CC 0 V V / 2 C C Jitter ISO7240CF, ISO7240C, ISO7240M ISO7241C, ISO7241M ISO7242C, ISO7242M SLLS868N – SEPTEMBER 2007 – REVISED JANUARY 2012 www.ti.com PARAMETER MEASUREMENT INFORMATION (continued) A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. B. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3 ns, tf ≤ 3 ns, ZO = 50Ω. Figure 5. Common-Mode Transient Immunity Test Circuit and Voltage Waveform NOTE: PRBS bit pattern run length is 216 – 1. Transition time is 800 ps. NRZ data input has no more than five consecutive 1s or 0s. Figure 6. Peak-to-Peak Eye-Pattern Jitter Test Circuit and Voltage Waveform DEVICE INFORMATION PACKAGE CHARACTERISTICS PARAMETER TEST CONDITIONS MIN TYP MAX UNIT L(I01) Minimum air gap (Clearance) Shortest terminal-to-terminal distance through air 8.34 mm Shortest terminal-to-terminal distance across the L(I02) Minimum external tracking (Creepage) 8.1 mm package surface Tracking resistance (comparative CTI DIN IEC 60112/VDE 0303 Part 1 ≥ 400 V tracking index) Minimum Internal Gap (Internal Distance through the insulation 0.008 mm Clearance) Input to output, VIO = 500 V, all pins on each side of the RIO Isolation resistance >1012 Ω barrier tied together creating a two-terminal device CIO Barrier capacitance Input to output VI = 0.4 sin (4E6πt) 2 pF CI Input capacitance to ground VI = 0.4 sin (4E6πt) 2 pF IEC 60664-1 RATINGS TABLE PARAMETER TEST CONDITIONS SPECIFICATION Basic isolation group Material group II Rated mains voltage ≤150 VRMS I-IV Installation classification Rated mains voltage ≤300 VRMS I-III 16 Copyright © 2007–2012, Texas Instruments Incorporated |
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