 |
Datenblatt-Suchmaschine für elektronische Bauteile |
|
|
Datenblatt-Suchmaschine für elektronische Bauteile |
|
5000 Datenblatt(PDF) 49 Page - Texas Instruments |
|
|
|||||||||||||||||||||||||||||
5000 Datenblatt(HTML) 49 Page - Texas Instruments |
|
|
49 / 68 page  www.ti.com Test Options on the EVM 8.5 Internally Generated Test Signal and Other Multiplexer Inputs ADS1299 internally generates a test signal that can be used for signal integrity check. Also the multiplexer provides options to measure supply voltage, temperature, etc. Details of these inputs can be found in Section 5.3. 8.6 Arbitrary Input Signal Any input signal can be fed to the device on connector J6 as described in Section 4.6. Figure 58 shows the results obtained when a single ended sinusoidal signal is applied to AIN1 by following the steps described in Section 4.6.2. Figure 58. Scope Tab with Sinusoidal Inputs on AIN1 49 SLAU443 – May 2012 EEG Front-End Performance Demonstration Kit Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated |
|
Link URL |
| War ALLDATASHEET hilfreich? [ DONATE ] |
Über Alldatasheet | Werbung | Kontakt | Privatsphäre und Datenschutz | Link zum Datenblatt | Linktausch | Hersteller All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
German ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
