BAT54W_SER

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Product data sheet

Rev. 3 — 20 November 2012

5 of 11

NXP Semiconductors

BAT54W series

Schottky barrier diodes

8.

Test information

8.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.

Fig 3.

Diode capacitance as a function of reverse voltage; typical values

006aac891

030

20

10

4

6

2

8

10

(pF)

0

Fig 4.

Reverse recovery time test circuit and waveforms

trr

(1)

t

output signal

t

10 %

90 %

input signal

D.U.T.

SAMPLING

OSCILLOSCOPE

mga881