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CDCLVD110AVF Datenblatt(PDF) 2 Page - Texas Instruments |
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CDCLVD110AVF Datenblatt(HTML) 2 Page - Texas Instruments |
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2 / 18 page ![]() CDCLVD110A SCAS841C – FEBRUARY 2007 – REVISED NOVEMBER 2009 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. FUNCTIONAL BLOCK DIAGRAM 2 Submit Documentation Feedback Copyright © 2007–2009, Texas Instruments Incorporated Product Folder Link(s): CDCLVD110A |
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