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DSA8300 Datenblatt(PDF) 5 Page - List of Unclassifed Manufacturers

Teilenummer DSA8300
Bauteilbeschribung  Digital Serial Analyzer Sampling Oscilloscope
PDF  26 Pages
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The DSA8300 is the industry’s highest-performance fully integrated Time
Domain Reflectometry (TDR) measurement system. Offering true-
differential TDR measurements up to 50 GHz bandwidth with 15 ps
reflected rise time and 12 ps incident rise time 5, the DSA8300 enables you
to keep pace with today’s most demanding Serial Data Network Analysis
(SDNA) requirements.
The 80E10B and 80E08B TDR modules feature a fully integrated
independent dual-channel 2-meter remote sampler system to minimize
fixturing and assure optimal system fidelity. Independent sampler deskew
ensures fast and easy fixture and probe de-embedding. The user can
characterize differential crosstalk by using TDR steps from a differential
module to drive one line pair while monitoring a second line pair with a
second differential module.
The DSA8300 is the industry’s most versatile TDR measurement system,
accommodating up to 4 dual-channel true-differential TDR modules for fast,
accurate multilane impedance and S-parameter characterization.
The P80318 True-differential TDR probe and P8018 Single-ended Passive
Handheld TDR probe provide high-performance probing solutions for circuit
board impedance and electrical signal characterization. The P80318, an
18 GHz 100 Ω input-impedance differential TDR hand probe, enables high-
fidelity impedance measurements of differential transmission lines. The
adjustable probe pitch enables a wide variety of differential line spacing and
impedances. The P8018 is a 20 GHz Single-ended Passive Handheld TDR
probe. Both the P80318 and P8018 can be used as stand-alone probes but
are especially designed to work with the 80A02 EOS/ESD module to
provide EOS/ESD protection.
Multi-gigabit signal path characterization and
analysis – Serial Data Network Analysis
(SDNA)
Serial data network analysis
As clock speeds and rise times of digital circuits increase, interconnect
signal integrity dramatically affects digital system performance. Accurate
and efficient Serial Data Network Analysis (SDNA) of the signal path and
interconnects in time and frequency domains is critical to predict signal
losses, jitter, crosstalk, terminations and ringing, digital bit errors, and eye
diagram degradation, ensuring reliable system operation.
Tektronix offers several true-differential TDR modules, which in
combination with IConnect
® software allow S-parameter measurements
with up to –70 dB of dynamic range. This performance assures accurate,
repeatable measurements in serial data analysis, digital design, signal
integrity, and electrical compliance testing applications.
TDR module performance with IConnect®
TDR Module
S-parameter measurement bandwidth performance
80E10B
50 GHz
80E08B
30 GHz
80E04
20 GHz
With the long record length acquisitions, IConnect
® provides great flexibility
for obtaining the desired frequency range and frequency step when
performing S-parameter measurements. Up to 1,000,000 points can be
acquired.
When you use IConnect
® Signal Integrity TDR and S-parameter software
with the DSA8300 you have an efficient, easy-to-use, and cost-effective
solution for measurement-based performance evaluation of multi-gigabit
interconnect links and devices, including signal integrity analysis,
impedance, S-parameter, and eye-diagram tests, and fault isolation.
IConnect
® can help you complete interconnect analysis tasks in minutes
instead of days, resulting in faster system design time and lower design
costs. IConnect
® also enables impedance, S-parameters, and eye-diagram
compliance testing as required by many serial data standards, as well as
full channel analysis, Touchstone (SnP) file output, and SPICE modeling for
multi-gigabit interconnects.
5
Rise times are 10-90%. Typical reflected rise times for the 80E10B are <10 ps.
DSA8300 Digital Serial Analyzer Sampling Oscilloscope
www.tektronix.com 5



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