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DSA8300 Datenblatt(PDF) 5 Page - List of Unclassifed Manufacturers |
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DSA8300 Datenblatt(HTML) 5 Page - List of Unclassifed Manufacturers |
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5 / 26 page ![]() The DSA8300 is the industry’s highest-performance fully integrated Time Domain Reflectometry (TDR) measurement system. Offering true- differential TDR measurements up to 50 GHz bandwidth with 15 ps reflected rise time and 12 ps incident rise time 5, the DSA8300 enables you to keep pace with today’s most demanding Serial Data Network Analysis (SDNA) requirements. The 80E10B and 80E08B TDR modules feature a fully integrated independent dual-channel 2-meter remote sampler system to minimize fixturing and assure optimal system fidelity. Independent sampler deskew ensures fast and easy fixture and probe de-embedding. The user can characterize differential crosstalk by using TDR steps from a differential module to drive one line pair while monitoring a second line pair with a second differential module. The DSA8300 is the industry’s most versatile TDR measurement system, accommodating up to 4 dual-channel true-differential TDR modules for fast, accurate multilane impedance and S-parameter characterization. The P80318 True-differential TDR probe and P8018 Single-ended Passive Handheld TDR probe provide high-performance probing solutions for circuit board impedance and electrical signal characterization. The P80318, an 18 GHz 100 Ω input-impedance differential TDR hand probe, enables high- fidelity impedance measurements of differential transmission lines. The adjustable probe pitch enables a wide variety of differential line spacing and impedances. The P8018 is a 20 GHz Single-ended Passive Handheld TDR probe. Both the P80318 and P8018 can be used as stand-alone probes but are especially designed to work with the 80A02 EOS/ESD module to provide EOS/ESD protection. Multi-gigabit signal path characterization and analysis – Serial Data Network Analysis (SDNA) Serial data network analysis As clock speeds and rise times of digital circuits increase, interconnect signal integrity dramatically affects digital system performance. Accurate and efficient Serial Data Network Analysis (SDNA) of the signal path and interconnects in time and frequency domains is critical to predict signal losses, jitter, crosstalk, terminations and ringing, digital bit errors, and eye diagram degradation, ensuring reliable system operation. Tektronix offers several true-differential TDR modules, which in combination with IConnect ® software allow S-parameter measurements with up to –70 dB of dynamic range. This performance assures accurate, repeatable measurements in serial data analysis, digital design, signal integrity, and electrical compliance testing applications. TDR module performance with IConnect® TDR Module S-parameter measurement bandwidth performance 80E10B 50 GHz 80E08B 30 GHz 80E04 20 GHz With the long record length acquisitions, IConnect ® provides great flexibility for obtaining the desired frequency range and frequency step when performing S-parameter measurements. Up to 1,000,000 points can be acquired. When you use IConnect ® Signal Integrity TDR and S-parameter software with the DSA8300 you have an efficient, easy-to-use, and cost-effective solution for measurement-based performance evaluation of multi-gigabit interconnect links and devices, including signal integrity analysis, impedance, S-parameter, and eye-diagram tests, and fault isolation. IConnect ® can help you complete interconnect analysis tasks in minutes instead of days, resulting in faster system design time and lower design costs. IConnect ® also enables impedance, S-parameters, and eye-diagram compliance testing as required by many serial data standards, as well as full channel analysis, Touchstone (SnP) file output, and SPICE modeling for multi-gigabit interconnects. 5 Rise times are 10-90%. Typical reflected rise times for the 80E10B are <10 ps. DSA8300 Digital Serial Analyzer Sampling Oscilloscope www.tektronix.com 5 |
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