7-311

Specifications CD4019BMS

Logic Diagram

FIGURE 1. CD4019BMS LOGIC DIAGRAM

Group B

Subgroup B-5

Sample 5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample 5005

1, 7, 9

Group D

Sample 5005

1, 2, 3, 8A, 8B, 9

Subgroups 1, 2 3

NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE GROUPS

MIL-STD-883

METHOD

TEST

READ AND RECORD

PRE-IRRAD

POST-IRRAD

PRE-IRRAD

POST-IRRAD

Group E Subgroup 2

5005

1, 7, 9

Table 4

1, 9

Table 4

TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS

FUNCTION

OPEN

GROUND

VDD

9V

± -0.5V

OSCILLATOR

50kHz

25kHz

Static Burn-In 1

Note 1

10 -13

1 - 9, 14, 15

16

Static Burn-In 2

Note 1

10 -13

8

1 - 7, 9, 14 - 16

Dynamic Burn-

In Note 1

-

8

16

10 - 13

-

1 - 7, 9, 14, 15

Irradiation

Note 2

10 -13

8

1 - 7, 9, 14 - 16

NOTE:

1. Each pin except VDD and GND will have a series resistor of 10K

± 5%, VDD = 18V ± 0.5V

2. Each pin except VDD and GND will have a series resistor of 47K

± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,

VDD = 10V

± 0.5V

TABLE 6. APPLICABLE SUBGROUPS

(Continued)

CONFORMANCE GROUP

MIL-STD-883

METHOD

GROUP A SUBGROUPS

READ AND RECORD

13

1

15

14

9

12

11

10

2

3

4

5

6

7

D3

D2

D1

D4

VDD = 16

VSS - 8

VDD

VSS

BY CMOS PROTECTION

NETWORK

TO 3 MORE

SIMILAR

CIRCUITS

TRUTH TABLE

Ka

Kb

An

Bn

Dn

101

X

1

100

X

0

01

X

1

1

01

X

0

0

00

X

X

0

11000

11011

11101

11111

X = Don’t Care Case