3

RH27C

TABLE 1A: ELECTRICAL CHARACTERISTICS

Note 6: See test circuit for current noise measurement on OP-27/OP-37

data sheet.

Note 7: The average input offset drift performance is within the specifica-

tions unnulled or when nulled with a pot having a range 8k

Ω to 20kΩ.

Note 8: The RH27C’s inputs are protected by back-to-back diodes. Current

limiting resistors are not used in order to achieve low noise. If differential

input voltage exceeds

±0.7V, the input current should be limited to 25mA.

Note 1: Input offset voltage measurements are performed by automatic

test equipment approximately 0.5 seconds after application of power.

Note 2: Long-term input offset voltage stability refers to the averaged

trend line of offset voltage vs time over extended periods after the first 30

during the first 30 days are typically 2.5

µV. Refer to the typical

performance curve.

Note 3: Sample tested to an LTPD of 15 on every lot. Contact factory for

100% testing of 10Hz voltage density noise.

Note 4: Parameter is guaranteed by design, characterization, or correlation

to other tested parameters.

Note 5: See test circuit and frequency response curve for 0.1Hz to 10Hz

tester on OP-27/OP-37 data sheet.

TOTAL DOSE BIAS CIRCUIT

10k

15V

–15V

10k

–1

µF

–1

µF

8V

TYPICAL PERFOR A CE CHARACTERISTICS

TOTAL DOSE KRAD (Si)

1

0

1

2

4

10

RH27C • TPC01

100

1000

3

TOTAL DOSE KRAD (Si)

1

0

1

2

4

10

RH27C • TPC02

100

1000

3

Positive Slew Rate

Negative Slew Rate

Information furnished by Linear Technology Corporation is believed to be accurate and reliable.

However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-

tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.