3

RH37C

TOTAL DOSE BIAS CIRCUIT

10k

15V

–15V

10k

8V

TYPICAL PERFOR A CE CHARACTERISTICS

TOTAL DOSE KRAD (Si)

1

25

20

15

10

5

0

10

RH37C G01

100

1000

TOTAL DOSE KRAD (Si)

1

25

20

15

10

0

10

RH37C G02

100

1000

Positive Slew Rate

Negative Slew Rate

TABLE 1A: ELECTRICAL CHARACTERISTICS

Note 6: See test circuit for current noise measurement on OP-27/OP-37

data sheet.

Note 7: The average input offset drift performance is within the specifica-

tions unnulled or when nulled with a pot having a range 8k

Ω to 20kΩ.

Note 8: The RH37C’s inputs are protected by back-to-back diodes. Current

limiting resistors are not used in order to achieve low noise. If differential

input voltage exceeds

±0.7V, the input current should be limited to 25mA.

Note 1: Input offset voltage measurements are performed by automatic

test equipment approximately 0.5 seconds after application of power.

Note 2: Long-term input offset voltage stability refers to the average trend

line of offset voltage vs time over the first 30 days of operation. Excluding

typically 2.5

µV. Refer to the typical performance curves.

Note 3: Sample tested to an LTPD of 15 on every lot. Contact factory for

100% testing of 10Hz voltage density noise.

Note 4: Parameter is guaranteed by design, characterization, or correlation

to other tested parameters.

Note 5: See test circuit and frequency response curve for 0.1Hz to 10Hz

tester on OP-27/OP-37 data sheet.

Information furnished by Linear Technology Corporation is believed to be accurate and reliable.

However, no responsibility is assumed for its use. Linear Technology Corporation makes no represen-

tation that the interconnection of its circuits as described herein will not infringe on existing patent rights.