8

Notes:

* For devices procured with a total ionizing dose tolerance guarantee, the post-irradiation performance is guaranteed at 25×C per MIL-STD-883 Method 1019, Condition

A up to the maximum TID level procured.

1. All specifications valid for radiation >1E5 rads(Si) per MIL-STD-883, Method 1019.

2. Verified by functional test.

Output Enable Time - GBA or GAB to An, Bn

3.5

9.5

ns

Output Enable Time - GBA or GAB to BPAR or APAR

3.5

9.5

ns

Output Enable Time - GBA or GAB to BPAR or APAR

3.5

9.5

ns

Output Disable Time - GBA or GAB to An, Bn

2.0

6.0

ns

Output Disable Time - GBA or GAB to An, Bn

2.0

6.0

ns

Output Disable Time - GBA or GAB to BPAR, to

APAR

2.0

6.0

ns

Output Disable Time - GBA or GAB to BPAR, to

APAR

2.0

6.0

ns

Setup Time, High or Low, An, Bn, APAR, BPAR to

LEA, LEB

1.0

ns

Hold Time, High or Low, An, Bn, APAR, BPAR to

LEA, LEB

1.5

ns

2

Pulse Width for LEA, LEB

4.0

ns

2

Maximum clock frequency

80

MHz

40pF

100ohms

100ohms

Notes

1. Equivalent test circuit means that DUT performance will be correlated and remain guaranteed to the applicable test circuit, above, whenever a test platform

change necessitates a deviation from the applicable test circuit.